Sprache: Englisch
Verlag: Braunschweig, Wiesbaden : Vieweg, 1979
ISBN 10: 3528081171 ISBN 13: 9783528081171
Anbieter: NEPO UG, Rüsselsheim am Main, Deutschland
Lw. Zustand: Gut. 225 S. : Ill., graph. Darst. ; 24 cm ex Library Book aus einer wissenschafltichen Bibliothek Sprache: Englisch Gewicht in Gramm: 550.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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In den WarenkorbZustand: New. In.
Verlag: Vieweg 1964-1979., Braunschweig, 1964
ISBN 10: 3528081171 ISBN 13: 9783528081171
Anbieter: Emile Kerssemakers ILAB, Heerlen, Niederlande
7 volumes. 24 cm. original cloth. approx 1600 pp. many ills. references. index. german and english texts. -(libr label, library stamps, with plasticized cover (einbandfolie), some volumes with slightly browned pages, otherwise (very) good). 777g.
Sprache: Deutsch
Verlag: Vieweg+Teubner Verlag, Vieweg+Teubner Verlag, 1979
ISBN 10: 3528081171 ISBN 13: 9783528081171
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Generally it is not sufficiently appreciated that electron microscopy is in fact a diffraction method. In essential aspects electron microscopes are more closely related to X-ray diffracto meters than to light microscopes. In electron microscopes monochromatized radiation and coherent illumination (never used in light microscopy) correspond in X-ray diffractometers to the primary beam with a small divergence. Imaging ina general sense can take place in interference experiments between a primary beam and a scattered beam, or between diffe rent deflected scattered beams. This leads to the realization of an old dream in diffracto metry, namely to a general experimental solution of the 'phase problem'. The most im pressive analogy, however, concerns the potential of the electron microscope as a tool for structure determination (where the radiation wavelenght is smaller than the atomic distan ces). It was therefore considered timely to treat this topic in this series. It was a fortunate cioncidence that in 1976 a Workshop on 'Unconventional Electron Microscope Methods for the Investigation of Molecular Structures' (sponsored by the European Molecular Biology Organisation, the Deutsche Forschungsgemeinschaft and the Max-Planck-Gesell schaft) took place, and that most speakers presenting introductory lectures agreed to publish their contributions in an expanded version in this volume. This volume is thus not a symposium report in the usual sense since it contains the majority of these introductory lectures only.
Anbieter: preigu, Osnabrück, Deutschland
Taschenbuch. Zustand: Neu. Unconventional Electron Microscopy for Molecular Structure Determination | W. Hoppe (u. a.) | Taschenbuch | vi | Deutsch | 1979 | Vieweg & Teubner | EAN 9783528081171 | Verantwortliche Person für die EU: Springer Vieweg in Springer Science + Business Media, Abraham-Lincoln-Str. 46, 65189 Wiesbaden, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.