ISBN: 9783319006802 - exploring memory hierarchy design with emerging memory technologies (lecture notes in electrical engineering, 267, band 267) (5 Ergebnisse)

Sprache: Englisch
Verlag: Springer, 2013
Serie: Buch 101 von 548 - Lecture Notes in Electrical Engineering
- Hardcover
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Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Sprache: Englisch
Verlag: Springer, 2013
Serie: Buch 101 von 548 - Lecture Notes in Electrical Engineering
- Hardcover
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Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques described offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the 'memory wall.' The authors discuss memory design from various perspectives: emerging memory technologies are employed in the memory hierarchy with novel architecture modification; hybrid memory structure is introduced to leverage advantages from multiple memory technologies; an analytical model named 'Moguls' is introduced to explore quantitatively the optimization design of a memory hierarchy; finally, the vulnerability of the CMPs to radiation-based soft errors is improved by replacing different levels of on-chip memory with STT-RAMs. …

Sprache: Englisch
Verlag: Springer Verlag, 2013
Serie: Buch 101 von 548 - Lecture Notes in Electrical Engineering
- Hardcover
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Hardcover. Zustand: Brand New. 2014 edition. 140 pages. 9.25x6.25x0.50 inches. In Stock.

Sprache: Englisch
Verlag: Springer, 2013
Serie: Buch 101 von 548 - Lecture Notes in Electrical Engineering
- Hardcover
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Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques described offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the ¿memory wall.¿ The authors discuss memory design from various perspectives: emerging memory technologies are employed in the memory hierarchy with novel architecture modification; hybrid memory structure is introduced to leverage advantages from multiple memory technologies; an analytical model named ¿Moguls¿ is introduced to explore quantitatively the optimization design of a memory hierarchy; finally, the vulnerability of the CMPs to radiation-based soft errors is improved by replacing different levels of on-chip memory with STT-RAMs. …

Sprache: Englisch
Verlag: Springer, 2013
Serie: Buch 101 von 548 - Lecture Notes in Electrical Engineering
- Hardcover
Anbieter: Buchpark, Trebbin, DeutschlandBuchpark
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Gebraucht
SonderangebotAktueller Preis: EUR 68,46
EUR 105,00 VersandVersand von Deutschland nach USAAnzahl: 1 verfügbar
Zustand: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher | This book equips readers with tools for computer architecture of high performance, low power, and high reliability memory hierarchy in computer systems based on emerging memory technologies, such as STTRAM, PCM, FBDRAM, etc. The techniques described offer advantages of high density, near-zero static power, and immunity to soft errors, which have the potential of overcoming the ¿memory wall.¿ The authors discuss memory design from various perspectives: emerging memory technologies are employed in the memory hierarchy with novel architecture modification; hybrid memory structure is introduced to leverage advantages from multiple memory technologies; an analytical model named ¿Moguls¿ is introduced to explore quantitatively the optimization design of a memory hierarchy; finally, the vulnerability of the CMPs to radiation-based soft errors is improved by replacing different levels of on-chip memory with STT-RAMs. …