Sprache: Englisch
Verlag: Cambridge University Press, 2001
ISBN 10: 1558996095 ISBN 13: 9781558996090
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 44,72
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Sprache: Englisch
Verlag: Materials Research Society, 2001
ISBN 10: 1558996095 ISBN 13: 9781558996090
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 60,84
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 248 pages. 9.10x6.20x0.80 inches. In Stock.
Sprache: Englisch
Verlag: Cambridge University Press, 2001
ISBN 10: 1558996095 ISBN 13: 9781558996090
Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Baker, S. P.; Freund, L. Ben; Kraft, Oliver; Schwarz, Klaus W.; Hull, Robert. Series: MRS Proceedings. Num Pages: 248 pages. BIC Classification: TGM. Category: (G) General (US: Trade). Dimension: 228 x 152 x 18. Weight in Grams: 455. . 2001. hardcover. . . . . Books ship from the US and Ireland.
Sprache: Englisch
Verlag: Cambridge University Press, 2001
ISBN 10: 1558996095 ISBN 13: 9781558996090
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The mechanical properties of small volumes of materials such as thin films and patterned structures can be very different from the mechanical properties of those same materials in bulk. Many explanations of the mechanical behaviors of such small volumes have depended on simplified models of dislocation behavior. However, recent developments in dislocation modeling have made it possible to understand dislocation behavior in much more detail than before. A wide range of topics is presented in these proceedings, including mechanisms of plastic deformation in heteroepitaxial, multilayered and polycrystalline thin films, as well as three-dimensional mesostructures such as epitaxial islands, semiconducting devices and microcrystallites. Experimental, theoretical and numerical simulations are addressed. Topics include: dislocation and deformation mechanisms in thin metal films and multilayers; discrete dislocations - observations and simulations; dislocations and deformation mechanisms in thin films and small structures; dislocations in small structures; dislocations and deformation in epitaxial layers; dislocation fundamentals -observations, calculations and simulations.