Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 164,50
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In den WarenkorbZustand: New. In.
Taschenbuch. Zustand: Neu. X-Ray Diffraction | A Practical Approach | C. Suryanarayana (u. a.) | Taschenbuch | xiii | Englisch | 2013 | Springer | EAN 9781489901507 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a 'hands on' approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
EUR 247,18
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In den WarenkorbPaperback. Zustand: Brand New. 286 pages. 9.30x6.20x0.65 inches. In Stock.