9781461349693 - scanning electron microscopy and x-ray microanalysis: third edition von goldstein, joseph; newbury, dale e.; joy, david c.; lyman, charles e.; echlin, patrick; lifshin, eric; sawyer, linda; michael, j.r. (5 Ergebnisse)
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.
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Scanning Electron Microscopy and X-Ray Microanalysis : Third Edition
Newbury, Dale E., Echlin, Patrick, Goldstein, Joseph, Joy, David C., Lyman, Charles E.
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Taschenbuch. Zustand: Neu. Scanning Electron Microscopy and X-Ray Microanalysis | Third Edition | Joseph Goldstein (u. a.) | Taschenbuch | xix | Englisch | 2013 | Springer | EAN 9781461349693 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com |… Anbieter: preigu.
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Paperback. Zustand: Brand New. 3rd edition. 708 pages. 10.00x7.00x1.75 inches. In Stock.
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The e…mergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and 'through-the-lens' detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.
