Verlag: The Institution of Engineering and Technology, 2007
ISBN 10: 0863417361 ISBN 13: 9780863417368
Sprache: Englisch
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In den WarenkorbZustand: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
Verlag: Institution of Engineering and Technology, 2008
ISBN 10: 0863417361 ISBN 13: 9780863417368
Sprache: Englisch
Anbieter: Studibuch, Stuttgart, Deutschland
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In den Warenkorbpaperback. Zustand: Gut. 397 Seiten; 9780863417368.3 Gewicht in Gramm: 500.
Verlag: INSTITUTION OF ENGINEERING & T, 2007
ISBN 10: 0863417361 ISBN 13: 9780863417368
Sprache: Englisch
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In den WarenkorbZustand: New. Über den AutorrnrnStuart Gregson MIET, MIoP, CEng, CPhys, CSci has BSc and MSc degrees in Physics from the University of Portsmouth, and a PhD from Queen Mary, University of London. He has special experience with near-field antenna measu.
Verlag: The Institution of Engineering and Technology, 2008
ISBN 10: 0863417361 ISBN 13: 9780863417368
Sprache: Englisch
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 167,79
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In den WarenkorbPaperback. Zustand: Brand New. 397 pages. 9.25x6.25x1.00 inches. In Stock.
Verlag: Institution Of Engineering & Technology Dez 2007, 2007
ISBN 10: 0863417361 ISBN 13: 9780863417368
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
EUR 174,06
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In den WarenkorbTaschenbuch. Zustand: Neu. Neuware - This single volume provides a comprehensive introduction and explanation of both the theory and practice of 'Planar Near-Field Antenna Measurement' from its basic postulates and assumptions, to the intricacies of its deployment in complex and demanding measurement scenarios. To do this the book initially examines the properties of antennas that allow them to enhance the free space interaction of electronic systems and this leads into a full description of the theory of 'Planar Near-Field Scanning'.The utility of the planar methodology is illustrated with example measurement campaigns that include discussion of the characterisation of a wide range of antennas. Advanced techniques including back transforms and poly-planar scan techniques, plus error assessment and correction, are examined and explained along with an extensive review of data assessment methodologies.A large number of near-field facilities exist worldwide but to the authors' knowledge no single text provides a clear step-by-step description of all the details of the 'Planar Near-Field Measurement Technique'. All three authors have spent a significant proportion of their professional careers involved with antenna measurements and the aim of this text is to provide the reader with a complete, comprehensive and practical text that will act as a single reference for all aspects of the measurement technique.