9780815511717 - electronics reliability and measurement technology: nondestructive evaluation von heyman, joseph s. (1 Ergebnisse)

Zustand: Good. 127 pp., Hardcover, ex library, else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.