Zustand: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 223,08
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Anbieter: preigu, Osnabrück, Deutschland
Taschenbuch. Zustand: Neu. Defects in SiO2 and Related Dielectrics: Science and Technology | Gianfranco Pacchioni (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2000 | Springer | EAN 9780792366867 | Verantwortliche Person für die EU: Springer Netherlands, Haberstr. 7, 69126 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbieter: preigu.
Sprache: Englisch
Verlag: Springer Netherlands, Springer, 2000
ISBN 10: 0792366867 ISBN 13: 9780792366867
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 302,81
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 632 pages. 9.50x6.50x1.50 inches. In Stock.