Sprache: Englisch
Verlag: Cambridge University Press, 2012
ISBN 10: 0521629950 ISBN 13: 9780521629959
Anbieter: Prior Books Ltd, Cheltenham, Vereinigtes Königreich
Erstausgabe
EUR 68,56
Anzahl: 1 verfügbar
In den WarenkorbPaperback. Zustand: Like New. First Edition. In nearly new condition: bright, crisp and clean with strong joints and sharp corners, just slightly shelf-worn. Hence a small publisher 'damaged' stamp at the prelims. Nonetheless not showing any defects. Looks and feels unread. Thus a very nice copy, firm, square and tight, now offered for sale at a very reasonable price.
Sprache: Englisch
Verlag: Cambridge University Press, 2012
ISBN 10: 0521629950 ISBN 13: 9780521629959
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 149,79
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. In.
Sprache: Englisch
Verlag: Cambridge University Press, 2012
ISBN 10: 0521629950 ISBN 13: 9780521629959
Anbieter: Kennys Bookstore, Olney, MD, USA
EUR 207,86
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003. Num Pages: 742 pages, 322 b/w illus. 25 tables 110 exercises. BIC Classification: PDND; PHFC; PNRS; PNRX; TGM. Category: (P) Professional & Vocational; (U) Tertiary Education (US: College). Dimension: 246 x 175 x 31. Weight in Grams: 1190. . 2012. Illustrated. paperback. . . . . Books ship from the US and Ireland.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 214,20
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. illustrated edition. 740 pages. 9.50x6.75x1.50 inches. In Stock.
Sprache: Englisch
Verlag: Cambridge University Press, 2012
ISBN 10: 0521629950 ISBN 13: 9780521629959
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.