9780521599443 - electron microprobe analysis: second edition von reed, s. j. b. (4 Ergebnisse)
- Softcover
Anbieter: Anybook.com, Lincoln, Vereinigtes KönigreichAnybook.com
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EUR 41,90
EUR 15,83 VersandVersand von Vereinigtes Königreich nach USAAnzahl: 1 verfügbar
Zustand: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In poor condition, suitable as a reading copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,550grams, ISBN:9780521599443.
- Softcover
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections
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EUR 74,40
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Zustand: New. In.
- Softcover
Anbieter: Kennys Bookstore, Olney, MD, USAKennys Bookstore
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EUR 99,97
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Zustand: New. 1993 paperback of successful physics monograph on electron microprobe analysis, a widely used technique. Num Pages: 350 pages, 12 colour illus. BIC Classification: PDND; PNFS; TJFD. Category: (P) Professional & Vocational. Dimension: 229 x 152 x 20. Weight in Grams: 510. . 1997. 2nd Edition. paperback. . . . . Book…s ship from the US and Ireland.
- Softcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
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EUR 103,11
EUR 30,50 VersandVersand von Deutschland nach USAAnzahl: 1 verfügbar
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This 1993 book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrume…nt, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.
