9780521350983 - Transmission Electron Microscopy of Minerals and Rocks (Cambridge Topics in Mineral Physics and Chemistry) von Alex C. McLaren (6 Ergebnisse)

Hardcover. X, 387 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. w05756 9780521350983 Sprache: Englisch Gewicht in Gramm: 550.

Zustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Shows some signs of wear but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.

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Zustand: New. An introduction to the principles of transmission electron microscopy, written specifically for geologists and mineralogists. Series: Cambridge Topics in Mineral Physics & Chemistry. Num Pages: 400 pages, 167 half-tones, 10 tables, 189 line diagrams. BIC Classification: PNV. Category: (P) Professional & Vocational; (U) Tertiary Education (US: College). Dimension: 228 x 152 x 22. . . 1991. 2nd Edition. hardcover. . . . . Books ship from the US and Ireland.

Hardcover. Zustand: Brand New. 2nd edition. 399 pages. 9.50x6.50x1.25 inches. In Stock.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Of the many techniques that have been applied to the study of crystal defects, none has contributed more to our understanding of their nature and influence on the physical and chemical properties of crystalline materials than transmission electron microscopy (TEM). TEM is now used extensively by an increasing number of earth scientists for direct observation of defect microstructures in minerals and rocks. Transmission Electron Microscopy of Minerals and Rocks is an introduction to the principles of the technique written specifically for geologists and mineralogists. The first part of the book deals with the essential physics of the transmission electron microscope and presents the basic theoretical background required for the interpretation of images and electron diffraction patterns. A knowledge of elementary crystallography is assumed, and some familiarity with optics and electromagnetic theory is helpful but not essential. The final chapters are concerned with specific applications of TEM in mineralogy and deal with such topics as planar defects, intergrowths, radiation-induced defects, dislocations and deformation-induced microstructures.