9780521184021 - reflection high-energy electron diffraction von ichimiya, ayahiko (4 Ergebnisse)
- Softcover
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Anbieter: Prior Books Ltd, Cheltenham, Vereinigtes KönigreichPrior Books Ltd
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Paperback. Zustand: Like New. First Edition. In nearly new condition: firm and square with strong joints, no creases. Just a few hardly noticeable cosmetic rubs. Hence a non-text page shows a small 'damaged' stamp. Despite such this book looks and feels unread. Thus the contents are crisp, fresh and tight. And so a very nice boo…k in great condition, now offered for sale at a reasonable price.
- Softcover
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections
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Zustand: New. In.
- Softcover
Anbieter: Kennys Bookstore, Olney, MD, USAKennys Bookstore
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EUR 105,78
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Zustand: New. An introduction to RHEED for beginners plus detailed experimental and theoretical treatments for experts. Num Pages: 366 pages, black & white illustrations. BIC Classification: PNRX; TGMT; TJFD5. Category: (UP) Postgraduate, Research & Scholarly. Dimension: 245 x 171 x 20. Weight in Grams: 578. . 2011. Reissue. pap…erback. . . . . Books ship from the US and Ireland.
- Softcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
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EUR 104,56
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introdu…ction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth.
