ISBN: 9780521017954 - reflection electron microscopy and spectotrophy for surface analysis (4 Ergebnisse)

Paperback. Zustand: Wie neu. Revised ed. 460 S.; Ill. Like new. Shrink wrapped. Sprache: Englisch Gewicht in Gramm: 845.

Zustand: New. In English.

Zustand: New. A self-contained book on electron microscopy and spectrometry techniques for surface studies. Num Pages: 460 pages, 224 b/w illus. 10 tables. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 24. Weight in Grams: 730. . 2008. Revised ed. paperback. . . . . Books ship from the US and Ireland. …

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.…