Isbn: 9780471624639 - built in test for vlsi: pseudorandom techniques (10 Ergebnisse)

Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Zustand: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

gebundene Ausgabe. Zustand: Gut. 354 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 650.…

HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Zustand: New. In English.

Zustand: New. pp. 368.

Gebunden. Zustand: New. Presents the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. The intention of this book is to present the material in a unified manner, making it a useful source for practising professionals and stud.

Hardcover. Zustand: Brand New. 368 pages. 10.00x6.50x1.00 inches. In Stock.

Buch. Zustand: Neu. Neuware - This handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.…

Zustand: New. Presents the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. The intention of this book is to present the material in a unified manner, making it a useful source for practising professionals and students. Num Pages: 368 pages, Ill. BIC Classification: TGMT; TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 240 x 181 x 26. Weight in Grams: 678. . 1987. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland. …