Hardcover. Zustand: Fair. No Jacket. Readable copy. Pages may have considerable notes/highlighting. ~ ThriftBooks: Read More, Spend Less.
Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
EUR 221,65
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In den WarenkorbHRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 237,27
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In den WarenkorbZustand: New. In.
EUR 295,64
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In den WarenkorbZustand: New. pp. 480.
EUR 257,59
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In den WarenkorbZustand: New. Closely follows an actual structural determination. After some introductory material on the nature of x--rays, the diffraction process, and the internal geometry of crystals, the selection and preparation of a crystal are considered. Techniques of measuring.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 344,80
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In den WarenkorbHardcover. Zustand: Brand New. 2nd sub edition. 480 pages. 9.75x6.50x0.75 inches. In Stock.
EUR 379,15
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. Closely follows an actual structural determination. After some introductory material on the nature of x--rays, the diffraction process, and the internal geometry of crystals, the selection and preparation of a crystal are considered. Techniques of measuring raw x--ray data are covered, plus their reduction into a useable form. Num Pages: 480 pages, index. BIC Classification: PNT. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 229 x 160 x 38. Weight in Grams: 908. . 1989. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland.
Buch. Zustand: Neu. Neuware - Closely follows an actual structural determination. After some introductory material on the nature of x-rays, the diffraction process, and the internal geometry of crystals, the selection and preparation of a crystal are considered. Techniques of measuring raw x-ray data are covered, plus their reduction into a useable form. The second part discusses both traditional and novel methods of solving the phase'' problem, the principal difficulty in x-ray structure determination. The third part considers how to extract the most information from the data and how to evaluate its reliability. Finally, there is a discussion of sources of error in practice and interpretation.