Isbn: 9780471492405 - semiconductor device and failure analysis using photon emmission microscopy: using photon emission microscopy (quality and reliability engineering series) (11 Ergebnisse)

hardcover. Zustand: Very Good.

Zustand: Very Good. : Este libro detalla la técnica PEM y su aplicación al análisis de dispositivos semiconductores. Ilustra la aplicación de la técnica PEM en varias áreas de la confiabilidad de los dispositivos, en particular la confiabilidad de portadores calientes, óxidos y ESD. Presenta los principios de diseño y calibración para un sistema de microscopio de emisión espectroscópica junto con la cobertura de los tres modos de operación principales: frontal, posterior y PEM espectroscópica. Proporciona un análisis de la emisión de luz en semiconductores bajo portadores calientes y estrés de impulso de alto campo en transistores MOS y emisión de fotones de capacitores MOS polarizados. EAN: 9780471492405 Tipo: Libros Categoría: Tecnología|Ciencias Título: Semiconductor Device and Failure Analysis Autor: Wai Kin Chim Editorial: Wiley Idioma: en Páginas: 288 Formato: tapa dura.…

Zustand: Good.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 288 | Sprache: Englisch | Produktart: Bücher | The diminishing size and greater complexity of modern semiconductor integrated circuits poses new challenges in fault detection. Photon Emission Microscopy (PEM) is a physical fault localisation technique used for analysing IC failures. Detailing the PEM technique and its application to semiconductor device analysis, this unique reference: * Illustrates the application of the PEM technique in various areas of device reliability, in particular hot-carrier, oxide and ESD reliability. * Presents the principles of design and calibration for a spectroscopic emission microscope system along with coverage of the three main operation modes: frontside, backside and spectroscopic PEM * Provides an analysis of light emission in semiconductors under hot-carrier and high-field impulse stressing in MOS transistors and photon emission from biased MOS capacitors. Not only an essential reference for researchers and students in the field, the numerous practical examples throughout the text also make this an indispensible guide for failure analysis engineers and microelectrics industry professionals.…

HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Zustand: New. In English.

Gebunden. Zustand: New. This reference details the principles of design, calibration, and use of photon emission microscopy (PEM) as a fault localization technique used for analyzing device reliability and failure. (SciTech Book News Vol. 25, No. 2 June 2001)The diminishing .

Hardcover. Zustand: Brand New. 1st edition. 269 pages. 9.25x6.25x1.00 inches. In Stock.

Buch. Zustand: Neu. Neuware - Integrierte Schaltkreise werden immer komplexer - deshalb wird es zunehmend schwieriger, Fehler schnell und treffsicher aufzuspüren. Die Photonenemissionsmikroskopie (PEM) ist eine Analysetechnik auf physikalischer Grundlage, die sich als Fehlererkennungsmethode bewährt hat. Dieser Band erläutert alle Aspekte dieser Methode, von der instrumentellen Ausrüstung über spezifische Details der Mikroskope bis hin zu Merkmalen der Photonenemission unter verschiedenen Bedingungen. (11/00).…

Zustand: New. Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits. Num Pages: 288 pages, Illustrations. BIC Classification: TJFD5. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 232 x 160 x 20. Weight in Grams: 534. . 2000. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.…

Hardcover. Zustand: gut. 2000. Semiconductor Device Failure Analysis In englischer Sprache. pages.