9780471319313 - Principles of Testing Electronic Systems (Wiley-Interscience) von Mourad, Samiha; Zorian, Yervant (9 Ergebnisse)

Zustand: Gut. Zustand: Gut | Seiten: 444 | Sprache: Englisch | Produktart: Bücher | A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references.

HRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.

Zustand: New. In.

Zustand: New. pp. xix + 420 Illus.

Gebunden. Zustand: New. Highly recommended for libraries serving undergraduate and graduate electrical engineering students and professional practitioners. (Choice, Vol. 38, No. 7, March 2001)SAMIHA MOURAD, PhD, is Professor of Electrical Engineering at Santa Clara Universit.

Hardcover. Zustand: Brand New. 1st edition. 420 pages. 9.25x6.50x1.25 inches. In Stock.

Zustand: New. A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. Num Pages: 440 pages, Illustrations. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 239 x 167 x 30. Weight in Grams: 784. . 2000. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.

Buch. Zustand: Neu. Neuware - Mit ausgesprochen pragmatischer Herangehensweise entwickelt dieses Buch ein phänomenologisches Verständnis der Prinzipien zur Testung elektronischer Schaltkreise. Anschauliche Beispiele und praktische Anwendungen empfehlen den Band nicht nur als Studienbegleiter, sondern auch als Nachschlagewerk für den Berufsalltag. Bildmaterial für Lehrveranstaltungen ist im Web abrufbar. (07/00).

Paperback. Zustand: Very Good. A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references. The book has been read, but is in excellent condition. Pages are intact and not marred by notes or highlighting. The spine remains undamaged.