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In den WarenkorbHRD. Zustand: New. New Book. Shipped from UK. Established seller since 2000.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
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In den WarenkorbZustand: New. In.
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In den WarenkorbZustand: New. pp. xxiv + 384 Illus.
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In den WarenkorbZustand: New. Dr Steven H. Voldman received his B.S. in Engineering Science from the University of Buffalo (1979) M.S. EE (1981) and Electrical Engineer Degree (1982) from M.I.T MS Engineering Physics (1986) and Ph.D EE (1991) from the University of Vermont under IBM s.
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In den WarenkorbZustand: New. Provides a comprehensive analysis of ESD failure mechanisms over a wide range of semiconductor materials, devices, circuits and applications. Sets out methods for eliminating failure mechanisms through workable circuit solutions, including practical examples of failure defects. Num Pages: 408 pages, Illustrations. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 252 x 176 x 27. Weight in Grams: 818. . 2009. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
Buch. Zustand: Neu. Neuware - Electrostatic discharge (ESD) failure mechanisms continue to impact semiconductor components and systems as technologies scale from micro- to nano-electronics.