ISBN: 9780443334825 - advances in data-driven modeling, fault detection, and fault identification: applications to chemical processes (2 Ergebnisse)

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  • Sprache: Englisch

    Verlag: Elsevier Science, 2025

    044333482X / 9780443334825

    • Softcover

    Anbieter: moluna, Greven, Deutschlandmoluna

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    Zustand: Neu

    EUR 251,95

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    Zustand: New. Seamlessly bridges the gap between experts and beginners by offering in-depth mathematical formulations for advanced users and simplified explanations for newcomers, ensuring clarity and comprehension for allOffers step-by-step instructions.

  • Sprache: Englisch

    Verlag: Elsevier Inc Okt 2025, 2025

    044333482X / 9780443334825

    • Softcover

    Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH

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    Zustand: Neu

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    Taschenbuch. Zustand: Neu. Neuware - Advances in Data-Driven Modeling, Fault Detection, and Fault Identification: Applications to Chemical Processes presents a comprehensive collection of research focused on data-driven modeling techniques for robust modeling, fault detection, and fault identification in chemical processes.This accessible guide caters to both academic and industrial researchers seeking to enhance their work with data-driven methodologies. The book begins with an overview of key methods, emphasizing their significance in research and industry applications. Chapters delve into various chemical processes, such as the Tennessee Eastman Process and a Fischer-Tropsch bench scale setup, to validate and compare the discussed techniques. The content is organized into three main categories: Basic and advanced robust empirical techniquesProminent empirical statistical charts for detecting faults in multivariate systemsConventional and novel, multiclass classification, machine-learning techniques for accurately distinguishing between different fault types in batch or real-time scenariosWhether a researcher or practitioner, this book is an essential resource for leveraging data-driven approaches in chemical engineering fields.…