9780306450457 - advances in x-ray analysis: volume 38 (5 Ergebnisse)

- Hardcover
Anbieter: Zubal-Books, Since 1961, Cleveland, OH, USAZubal-Books, Since 1961
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Gebraucht - Gut
EUR 92,85
EUR 3,88 VersandVersand innerhalb von USAAnzahl: 1 verfügbar
Zustand: Very Good. 813 pp., hardcover, minor library markings else text clean & binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by rec…ipient's country. Photos available upon request.

- Hardcover
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Neu
EUR 311,27
EUR 13,89 VersandVersand von Vereinigtes Königreich nach USAAnzahl: Mehr als 20 verfügbar
Zustand: New. In.

- Hardcover
Anbieter: moluna, Greven, , Deutschlandmoluna
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Neu
EUR 338,28
EUR 48,99 VersandVersand von Deutschland nach USAAnzahl: Mehr als 20 verfügbar
Gebunden. Zustand: New. The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950 s into an international forum f.

Advances in X-Ray Analysis: Proceedings of the 43rd Annual Conference Held in Steamboat Springs, Colorado, August 1-5, 1994 v. 38 (Advances in X-Ray Analysis Vol. 38)
Bowen, D.K. (Editor) / Gilfrich, John V. (Editor) / Goldsmith, C.C. (Editor) / Huang, Ting C. (Editor) / Jenkins, Ron (Editor) / Noyan, I. Cev (Editor) / Predecki, Paul K. (Editor) / Smith, Deane K. (Editor)
- Hardcover
Anbieter: Revaluation Books, Exeter, , Vereinigtes KönigreichRevaluation Books
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Neu
EUR 461,31
EUR 23,18 VersandVersand von Vereinigtes Königreich nach USAAnzahl: 2 verfügbar
Hardcover. Zustand: Brand New. 787 pages. 10.25x7.00x1.75 inches. In Stock.

- Hardcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
Verkäufer/-in kontaktierenVerkäufer/-in mit 5 SternenZustand: Neu
EUR 418,96
EUR 67,37 VersandVersand von Deutschland nach USAAnzahl: 2 verfügbar
Buch. Zustand: Neu. Neuware - The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950's into an international forum for the interaction of scientists, engineers… and technologists interested in the use of x-rays in materials characterization. It has not only acted as a venue but has both stimulated and nurtured many of the principal developments in this field over the years. The major changes that have been occurring on the national and international scene as a result of the end of the cold war have dramatic-ally affected the way the materials community does business. The removal of defense priorities and development funds from most new materials initiatives has stimulated the char acterization communities to look to increasing the speed of their methods. This is being accom plished via the development of very fast dynamic characterization procedures which can rapidly and intelligently monitor and optimize the formation of a desired microstructure. The develop ment of intelligent characterization procedures applied in real-time during the manufacturing process can lead to the ability to design desired microstructures. Another potential advantage to this approach is its ability to characterize the actual amount of material which goes into a final product; permitting a rapid transition from R&D to manufacturing by avoiding the prob lems associated with scale-up.