ISBN: 9780124095014 - applications of random process excursion analysis (elsevier insights) (5 Ergebnisse)

- Hardcover
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes KönigreichGreatBookPricesUK
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EUR 168,26
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Zustand: New.

- Hardcover
Anbieter: GreatBookPricesUK, Woodford Green, Vereinigtes KönigreichGreatBookPricesUK
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EUR 170,40
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Zustand: As New. Unread book in perfect condition.

- Hardcover
Anbieter: Rarewaves.com USA, London, LONDO, Vereinigtes KönigreichRarewaves.com USA
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EUR 195,54
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Hardback. Zustand: New. This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics.…

- Hardcover
Anbieter: moluna, Greven, Deutschlandmoluna
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EUR 176,92
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Zustand: New. Introduces English-speaking students and researchers in to the results obtained in the former Soviet/ Russian academic institutions within last few decades. Supplies a range of applications suitable for all levels from undergraduate to pro.

- Hardcover
Anbieter: Rarewaves.com UK, London, Vereinigtes KönigreichRarewaves.com UK
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EUR 189,80
EUR 77,90 VersandVersand von Vereinigtes Königreich nach USAAnzahl: Mehr als 20 verfügbar
Hardback. Zustand: New. This book addresses one of the key problems in signal processing, the problem of identifying statistical properties of excursions in a random process in order to simplify the theoretical analysis and make it suitable for engineering applications. Precise and approximate formulas are explained, which are relatively simple and can be used for engineering applications such as the design of devices which can overcome the high initial uncertainty of the self-training period. The information presented in the monograph can be used to implement adaptive signal processing devices capable of detecting or recognizing the wanted signals (with a priori unknown statistical properties) against the background noise. The applications presented can be used in a wide range of fields including medicine, radiolocation, telecommunications, surface quality control (flaw detection), image recognition, thermal noise analysis for the design of semiconductors, and calculation of excessive load in mechanics.…