violante massimo (16 Ergebnisse)

Zustand: good. Befriedigend/Good: Durchschnittlich erhaltenes Buch bzw. Schutzumschlag mit Gebrauchsspuren, aber vollständigen Seiten. / Describes the average WORN book or dust jacket that has all the pages present.

Zustand: very good. Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: Neuf.

Hardcover. Zustand: Good. 2006. It's a preowned item in good condition and includes all the pages. It may have some general signs of wear and tear, such as markings, highlighting, slight damage to the cover, minimal wear to the binding, etc., but they will not affect the overall reading experience.

Zustand: very good. Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.

Zustand: good. Befriedigend/Good: Durchschnittlich erhaltenes Buch bzw. Schutzumschlag mit Gebrauchsspuren, aber vollständigen Seiten. / Describes the average WORN book or dust jacket that has all the pages present.

Zustand: New. pp. 192 Illus.

Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.As well as giving rise to new design practices, SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the necessary infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction such as higher functional performance and greater operating speed. Research efforts are already addressing this issue.System-level Test and Validation of Hardware/Software Systems provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including:¿ modeling of bugs and defects;¿ stimulus generation for validation and test purposes (including timing errors;¿ design for testability.For researchers working on system-level validation and testing, for tool vendors involved in developing hardware-software co-design tools and for graduate students working in embedded systems and SOC design and implementation, System-level Test and Validation of Hardware/Software Systems will be an invaluable source of reference.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue.This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including:modeling of bugs and defects;stimulus generation for validation and test purposes (including timing errors;design for testability.

Gebunden. Zustand: New. The reader will learn about the state of the art in system-level validation and test procedures which will enhance both the reliability and performance of system on chip designsMatteo Sonza Reorda is the leader of the computer-aided design gro.

Zustand: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher | Reconfigurable Field Programmable Gate Arrays for Mission-Critical Applicationsby: Niccolö BattezzatiLuca SterponeMassimo Violante This book describes the challenges faced by designers when implementing a mission- or safety-critical application using re-configurable FPGAs and it details various techniques to overcome these challenges. In addition to an overview of the key concepts of re-configurable FPGAs, it provides a theoretical description of the failure modes that can cause incorrect operation of re-configurable FPGA-based electronic systems. It also outlines analysis techniques that can be used to forecast such failures and covers the theory behind solutions to mitigate fault effects. This book also reviews current technologies available for building re-configurable FPGAs, specifically SRAM-based technology and Flash-based technology. For each technology introduced, theoretical concepts presented are applied to real cases. Design techniques and tools are presented to develop critical applications using commercial, off-the-shelf devices, such as Xilinx Virtex FPGAs, and Actel ProASIC FPGAs. Alternative techniques based on radiation hardened FPGAs, such as Xilinx SIRF and Atmel ATF280 are also presented.This book is an invaluable reference for anyone interested in understanding the technologies of re-configurable FPGAs, as well as designers developing critical applications based on these technologies. ¿Describes challenges faced when implementing a mission- or safety-critical application using re-configurable FPGAs and offers techniques to overcome these challenges;¿Provides an overview of the key concepts of re-configurable FPGAs, as well as a theoretical description of their failure modes;¿Presents analysis techniques that can be used to forecast failures and covers the theory behind solutions to mitigate fault effects;¿Reviews current technologies available for building re-configurable FPGAs and applies theoretical concepts toreal cases.

Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Reconfigurable Field Programmable Gate Arrays for Mission-Critical Applicationsby: Niccolö BattezzatiLuca SterponeMassimo Violante This book describes the challenges faced by designers when implementing a mission- or safety-critical application using re-configurable FPGAs and it details various techniques to overcome these challenges. In addition to an overview of the key concepts of re-configurable FPGAs, it provides a theoretical description of the failure modes that can cause incorrect operation of re-configurable FPGA-based electronic systems. It also outlines analysis techniques that can be used to forecast such failures and covers the theory behind solutions to mitigate fault effects. This book also reviews current technologies available for building re-configurable FPGAs, specifically SRAM-based technology and Flash-based technology. For each technology introduced, theoretical concepts presented are applied to real cases. Design techniques and tools are presented to develop critical applications using commercial, off-the-shelf devices, such as Xilinx Virtex FPGAs, and Actel ProASIC FPGAs. Alternative techniques based on radiation hardened FPGAs, such as Xilinx SIRF and Atmel ATF280 are also presented.This book is an invaluable reference for anyone interested in understanding the technologies of re-configurable FPGAs, as well as designers developing critical applications based on these technologies. ¿Describes challenges faced when implementing a mission- or safety-critical application using re-configurable FPGAs and offers techniques to overcome these challenges;¿Provides an overview of the key concepts of re-configurable FPGAs, as well as a theoretical description of their failure modes;¿Presents analysis techniques that can be used to forecast failures and covers the theory behind solutions to mitigate fault effects;¿Reviews current technologies available for building re-configurable FPGAs and applies theoretical concepts toreal cases.

Buch. Zustand: Neu. Neuware - New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers.SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue.This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including:modeling of bugs and defects;stimulus generation for validation and test purposes (including timing errors;design for testability.

Gebunden. Zustand: New. No other comprehensive reference on software-implemented hardware fault tolerance is now availableServes as a developers guideHighlights unsolved issues in SIHFTNo other comprehensive reference on software-implemented hardware fa.

Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.