Strojwas andrzej (14 Ergebnisse)

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  • Sprache: Englisch

    Verlag: Kluwer Academic Publishers, Dordrecht, Holland, 1997

    0792380797 / 9780792380795

    • Hardcover
    • Erstausgabe

    Anbieter: PsychoBabel & Skoob Books, Didcot, Vereinigtes KönigreichPsychoBabel & Skoob Books

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    Zustand: Gebraucht - Gut

    EUR 32,26

    EUR 14,64 Versand 
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    Anzahl: 1 verfügbar

    hardcover. Zustand: Very Good. No Dust Jacket. First Edition. Hardback in very good condition. Printed boards, a little scuffed; previous owner's name on FEP, no jacket as issued; contents clean, sound, bright. TPW. Used.

  • Sprache: Englisch

    Verlag: Springer, 2011

    1461288169 / 9781461288169

    • Softcover

    Anbieter: Hamelyn, Madrid, M, SpanienHamelyn

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    Zustand: Gebraucht - Gut

    EUR 40,28

    EUR 11,99 Versand 
    Versand von Spanien nach USA

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    Zustand: Bueno. : Este libro trata sobre el diseño VLSI para la fabricación y la mejora del rendimiento. Cubre temas de ingeniería de sistemas e ingeniería informática. Es un recurso en línea que también está disponible en forma impresa. El libro forma parte de 'The Kluwer International Series in Engineering and Computer Science'. EAN: 9781461288169 Tipo: Libros Categoría: Tecnología|Ciencias Título: VLSI Design for Manufacturing: Yield Enhancement Autor: Stephen W. Director| Wojciech Maly| Andrzej J. Strojwas Editorial: Springer US Idioma: en Páginas: 308 Formato: Tapa blanda.…

  • Sprache: Englisch

    Verlag: Springer, 2012

    1461346398 / 9781461346395

    • Softcover

    Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections

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    Zustand: Neu

    EUR 128,71

    EUR 10,97 Versand 
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    Zustand: New. In English.

  • Sprache: Englisch

    Verlag: Springer, 1997

    0792380797 / 9780792380795

    • Hardcover

    Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections

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    Zustand: Neu

    EUR 128,71

    EUR 13,22 Versand 
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    Zustand: New. In English.

  • Sprache: Englisch

    Verlag: Springer US, 1997

    0792380797 / 9780792380795

    • Hardcover

    Anbieter: Buchpark, Trebbin, DeutschlandBuchpark

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    Zustand: Gebraucht - Gut

    EUR 35,62

    EUR 105,00 Versand 
    Versand von Deutschland nach USA

    Anzahl: 1 verfügbar

    Zustand: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.…

  • Sprache: Englisch

    Verlag: Springer, 1997

    0792380797 / 9780792380795

    • Hardcover

    Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH

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    Zustand: Neu

    EUR 117,28

    EUR 35,00 Versand 
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    Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.…

  • Sprache: Englisch

    Verlag: Springer, 2012

    1461346398 / 9781461346395

    • Softcover

    Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH

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    Zustand: Neu

    EUR 117,28

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    Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.…

  • Sprache: Englisch

    Verlag: Kluwer Academic Publishers, 1997

    0792380797 / 9780792380795

    • Hardcover

    Anbieter: Kennys Bookstore, Olney, MD, USAKennys Bookstore

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    Zustand: Neu

    EUR 169,26

    EUR 9,27 Versand 
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    Anzahl: 15 verfügbar

    Zustand: New. This text applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. Num Pages: 155 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 11. Weight in Grams: 426. . 1997. Hardback. . . . . Books ship from the US and Ireland.…

  • Sprache: Englisch

    Verlag: Springer US, 2012

    1461346398 / 9781461346395

    • Softcover

    Anbieter: Buchpark, Trebbin, DeutschlandBuchpark

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    Zustand: Gebraucht - Sehr gut

    EUR 81,18

    EUR 105,00 Versand 
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    Anzahl: 1 verfügbar

    Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing.…

  • Sprache: Englisch

    Verlag: Springer, 2011

    1461288169 / 9781461288169

    • Softcover

    Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections

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    Zustand: Neu

    EUR 183,13

    EUR 13,22 Versand 
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    Zustand: New. In English.

  • Sprache: Englisch

    Verlag: Springer, 1989

    0792390547 / 9780792390541

    • Hardcover

    Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections

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    Zustand: Neu

    EUR 183,13

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    Zustand: New. In English.

  • Sprache: Englisch

    Verlag: Springer US, 1989

    0792390547 / 9780792390541

    • Hardcover

    Anbieter: moluna, Greven, Deutschlandmoluna

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    Zustand: Neu

    EUR 180,97

    EUR 48,99 Versand 
    Versand von Deutschland nach USA

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    Gebunden. Zustand: New. One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufac.

  • Sprache: Englisch

    Verlag: Kluwer Academic Publishers, 1989

    0792390547 / 9780792390541

    • Hardcover

    Anbieter: Kennys Bookstore, Olney, MD, USAKennys Bookstore

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    Zustand: Neu

    EUR 257,99

    EUR 9,27 Versand 
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    Anzahl: 15 verfügbar

    Zustand: New. Series: The Springer International Series in Engineering and Computer Science. Num Pages: 292 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 234 x 156 x 19. Weight in Grams: 609. . 1989. Hardback. . . . . Books ship from the US and Ireland. …

    • Hardcover

    Anbieter: Celler Versandantiquariat, Eicklingen, DeutschlandCeller Versandantiquariat

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    Verbandsmitglied: GIAQ

    Zustand: Gebraucht

    EUR 26,00

    EUR 38,00 Versand 
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    Anzahl: 1 verfügbar

    In den Warenkorb

    Kluwer, Boston, 1990. XII, 291 pages with some graphics, hardcover, (former library book)--- 750 Gramm.