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Zustand: Like New. Used - Like New. Book is new and unread but may have minor shelf wear.

Hardcover. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 1.25.

hardcover. Zustand: Very Good. Zustand des Schutzumschlags: No Dust Jacket. First Edition. Hardcover with black lettering on spine and upper board and contents in almost new condition, showing minimal signs of wear. Previous owner's name on FEP. No dust jacket. T. Used.

hardcover. Zustand: Very Good. Zustand des Schutzumschlags: No Dust Jacket. First Edition. Blue hardcover with black lettering on spine and upper board and contents in very good clean condition, showing minimal signs of wear. Previous owner's name on FEP. Profusely illustrated by diagrams and tables. No dust jacket. T. Used.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 260 | Sprache: Englisch | Produktart: Bücher.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 195 | Sprache: Englisch | Produktart: Bücher.

Zustand: New.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits draws upon ideas for attacking parallel problems in other technical fields, such as computational finance, machine learning and actuarial risk, and synthesizes them with innovative attacks for the problem domain of integrated circuits. The result is a set of novel solutions to problems of efficient statistical analysis of circuits in the nanometer regime.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Cell-based design methodologies have dominated layout generation of digital circuits. Unfortunately, the growing demands for transparent process portability, increased performance, and low-level device sizing for timing/power are poorly handled in a fixed cell library. Direct Transistor-Level Layout For Digital Blocks proposes a direct transistor-level layout approach for small blocks of custom digital logic as an alternative that better accommodates demands for device-level flexibility. This approach captures essential shape-level optimizations, yet scales easily to netlists with thousands of devices, and incorporates timing optimization during layout. The key idea is early identification of essential diffusion-merged MOS device groups, and their preservation in an uncommitted geometric form until the very end of detailed placement. Roughly speaking, essential groups are extracted early from the transistor-level netlist, placed globally, optimized locally, and then finally committed each to a specific shape-level form while concurrently optimizing for both density and routability. The essential flaw in prior efforts is an over-reliance on geometric assumptions from large-scale cell-based layout algorithms. Individual transistors may seem simple, but they do not pack as gates do. Algorithms that ignore these shape-level issues suffer the consequences when thousands of devices are poorly packed. The approach described in this book can pack devices much more densely than a typical cell-based layout.Direct Transistor-Level Layout For Digital Blocks is a comprehensive reference work on device-level layout optimization, which will be valuable to CAD tool and circuit designers.

Zustand: Gut. Zustand: Gut | Seiten: 768 | Sprache: Englisch | Produktart: Sonstiges.

Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.

Zustand: New. In.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Knowledge exists: you only have to nd it VLSI design has come to an important in ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5-6s (0.

Zustand: New. In.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book, and the research it describes, resulted from a simple observation we made sometime in 1986. Put simply, we noticed that many VLSI design tools looked 'alike'. That is, at least at the overall software architecture level, the algorithms and data structures required to solve problem X looked much like those required to solve problem X'. Unfortunately, this resemblance is often of little help in actually writing the software for problem X' given the software for problem X. In the VLSI CAD world, technology changes rapidly enough that design software must continually strive to keep up. And of course, VLSI design software, and engineering design software in general, is often exquisitely sensitive to some aspects of the domain (technology) in which it operates. Modest changes in functionality have an unfortunate tendency to require substantial (and time-consuming) internal software modifications. Now, observing that large engineering software systems are technology dependent is not particularly clever. However, we believe that our approach to xiv Preface dealing with this problem took an interesting new direction. We chose to investigate the extent to which automatic programming ideas cold be used to synthesize such software systems from high-level specifications. This book is one of the results of that effort.

Zustand: New. In.