Ritchie nicholas (30 Ergebnisse)
Sprache: Englisch
Verlag: CreateSpace Independent Publishing Platform, 2014
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Paperback. Zustand: Very Good. The Essence of Success: 12 Mini Biographies: Richard Branson Bill Gates Nelson Mandela Steven Spielberg Stephen Hawking Chris Evans Frank Sinatra Tony . Malcolm X James Dyson & Margaret Thatcher This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have…some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
Sprache: Englisch
Verlag: CreateSpace Independent Publishing Platform 31/10/2014, 2014
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Paperback. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less. Russell, Greeta (illustrator).
Sprache: Englisch
Verlag: CreateSpace Independent Publishing Platform, 2014
- Softcover
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Paperback. Zustand: Used; Very Good. Dispatched, from the UK, within 48 hours of ordering. Though second-hand, the book is still in very good shape. Minimal signs of usage may include very minor creasing on the cover or on the spine.
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Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,350grams, ISBN:0859413217.
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PAP. Zustand: New. New Book. Shipped from UK. Established seller since 2000. Russell, Greeta (illustrator).
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PAP. Zustand: New. New Book. Shipped from UK. Established seller since 2000. Russell, Greeta (illustrator).
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Paperback. Zustand: Brand New. 153 pages. 8.00x5.00x0.35 inches. In Stock.
Sprache: Englisch
Verlag: Woodhead-Faulkner in association with Lloyds Bank, 1986
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Zustand: Poor. Front cover has a crease, outer edges have minor scuffs, book content is in good readable condition.
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Zustand: New. In. Russell, Greeta (illustrator).
Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.
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Hardcover. Zustand: Fair. Fourth Edition 2018. The item might be beaten up but readable. May contain markings or highlighting, as well as stains, bent corners, or any other major defect, but the text is not obscured in any way.
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Paperback. Zustand: Brand New. 194 pages. 9.22x6.15x9.21 inches. In Stock.
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Taschenbuch. Zustand: Neu. Neuware - Perspectives on Love and Pain is the third publication by Missy Ritchie Nicholas. Missy is a licensed clinical social worker, psychotherapist, and public speaker. Her other works include Letters to Love and Therapy Tip of the Day. Russell, Greeta (illustrator).
Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.
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Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.
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hardcover. Zustand: Very Good. pages clean and unmarked. cover shows minor bumped edges.
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Zustand: New. 2025. First Edition. hardcover. . . . . . Books ship from the US and Ireland.
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MultiSpecies Dementia Studies Towards an Interdisciplinary Approach
Nicholas Jenkins|Anna Jackwaugh|Louise Ritchie|Louise Ritchie
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Zustand: New. Über den AutorNicholas Jenkins is a Senior Lecturer in Sociology and Social Policy at the University of the West of Scotland and a former Chancellor s Fellow of the University of Edinburgh. Anna Jack Waugh is a Senior Lecturer in De.
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Buch. Zustand: Neu. Neuware - Dementia is one of the greatest challenges facing humanity in the 21st century. Responding to the global dementia challenge, however, affects more than humans alone. We live in a multi-species world but often think about dementia in mono-species ways. From the lab to the living room, other beings ar…e 'on the scene' and our relations with them affect how we understand, experience, and respond to dementia. Drawing on cutting-edge work across the social and biological sciences, this book offers readers the tools to respond to dementia in multi-species ways. By exploring a range of topics, from pathology to personhood, contributors highlight how thinking about dementia as a more-than-human phenomenon may enable new ways of responding to our global dementia challenge.
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis…, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a 'dual beam' platform incorporating bothelectron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to 'read it all' to understand a topicIncludesan.
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Buch. Zustand: Neu. Multi-Species Dementia Studies | Towards an Interdisciplinary Approach | Nicholas Jenkins | Buch | Einband - fest (Hardcover) | Englisch | 2025 | Bristol University Press | EAN 9781447368793 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: pr…eigu.
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Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, elect…ron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a 'dual beam' platform incorporating bothelectron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to 'read it all' to understand a topicIncludesan.
MultiSpecies Dementia Studies Towards an Interd isciplinary Approach
Jenkins, Nicholas (Editor)/ Jack-waugh, Anna (Editor)/ Ritchie, Louise (Editor)
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Hardcover. Zustand: Brand New. gld edition. 208 pages. 9.21x6.14x9.21 inches. In Stock.
Scanning Electron Microscopy and X-ray Microanalysis
Goldstein, Joseph/ Newbury, Dale/ Joy, David C./ Michael, Joseph/ Ritchie, Nicholas W. M.
- Hardcover
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Hardcover. Zustand: Brand New. 4th edition. 550 pages. 11.25x8.50x1.50 inches. In Stock.














