Verlag: Springer US, 2011
ISBN 10: 1461294991 ISBN 13: 9781461294993
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.
Verlag: Springer, Berlin, 1992
ISBN 10: 0306442493 ISBN 13: 9780306442490
Anbieter: moluna, Greven, Deutschland
Gebunden. Zustand: New. Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrument.
Verlag: Springer US, 1995
ISBN 10: 0306450453 ISBN 13: 9780306450457
Anbieter: moluna, Greven, Deutschland
Gebunden. Zustand: New. The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950 s into an international forum f.
Verlag: Springer US, 1998
ISBN 10: 0306458039 ISBN 13: 9780306458033
Anbieter: moluna, Greven, Deutschland
Gebunden. Zustand: New. Proceedings of the Forty-fourth Annual Conference on Applications of X-Ray Analysis held in Colorado, Springs, Colorado, July 31-August 4, 1995 The 39th Denver Conference on Applications of X-ray Analysis was held July 31-August 4, 1995, at the Sherat.
Verlag: Kluwer Academic/Plenum Publishers, 1998
ISBN 10: 0306458039 ISBN 13: 9780306458033
Anbieter: Ammareal, Morangis, Frankreich
Hardcover. Zustand: Bon. Ancien livre de bibliothèque. Légères traces d'usure sur la couverture. Tome 39. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Slight signs of wear on the cover. Tome 39. Ammareal gives back up to 15% of this item's net price to charity organizations.