hardcover. Zustand: Gut. 887 Seiten; 9783540286035.3 Gewicht in Gramm: 3.
Zustand: Hervorragend. Zustand: Hervorragend | Seiten: 904 | Sprache: Englisch | Produktart: Bücher | X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006
ISBN 10: 3540286039 ISBN 13: 9783540286035
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Buch. Zustand: Neu. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg Jun 2006, 2006
ISBN 10: 3662496011 ISBN 13: 9783662496015
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Taschenbuch. Zustand: Neu. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 1.007,15
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 1st edition. 863 pages. 9.00x6.25x1.50 inches. In Stock.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2006
ISBN 10: 3662496011 ISBN 13: 9783662496015
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Sprache: Englisch
Verlag: Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2006
ISBN 10: 3540286039 ISBN 13: 9783540286035
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 1.005,58
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 2006 edition. 878 pages. 9.25x6.10x2.01 inches. In Stock.
Sprache: Deutsch
Verlag: Leipziger Universitätsvlg Okt 2025, 2025
ISBN 10: 3960236735 ISBN 13: 9783960236733
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - Professor Dr. Ing., Dr. sc. techn. Norbert Langhoff, ehemaliger Direktor des Zentrums für wissenschaftlichen Gerätebau der Akademie der Wissenschaften der DDR, nach der Wende erfolgreicher Unternehmer und Netzwerker und Dr. sc. oec. Klaus Meier, Wissenschaftssoziologe und -historiker, der seit über 50 Jahren die Entwicklung der Wissenschaftslandschaft in Ostdeutschland begleitet, versammeln im vorliegenden Band Beiträge von Wissenschaftlern, die das 'Wunder von Adlershof' - die Erfolgsgeschichte von Deutschlands größtem Wissenschafts- und Technologiepark - mitgestaltet haben.Als die Akademie der Wissenschaften der DDR per Einigungsvertrag ihr Wirken einstellte, waren es vor allem junge, hoch motivierte Forscher und Ingenieure, die mit ihren Kompetenzen und Projekten den Schritt in die Selbständigkeit wagten. Aus ihren 'Rettungsbooten' entwickelten sich in den rauen Gewässern der Marktwirtschaft Hidden Champions. Im Zeichen des sich nunmehr vollziehenden Generationswechsels berichten die Unternehmer über die kritischen Anfangsjahre und die Entwicklung jener Strategien, mit denen sich ihre Firmen an der Weltspitze behaupten konnten.
Anbieter: preigu, Osnabrück, Deutschland
Buch. Zustand: Neu. Leucht-Türme. Adlershofer Hightech-Firmen und ihre Geschichte | Von der Akademie der Wissenschaften zu Science at Work | Norbert Langhoff (u. a.) | Buch | 622 S. | Deutsch | 2025 | Leipziger Universitätsvlg | EAN 9783960236733 | Verantwortliche Person für die EU: Leipziger Universitätsverlag GmbH, Oststr. 41, 04317 Leipzig, info[at]univerlag-leipzig[dot]de | Anbieter: preigu.