Lifshin eric (18 Ergebnisse)

Hardcover. Zustand: Good. No Jacket. Missing dust jacket; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Zustand: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Zustand: Very Good. No Jacket. Missing dust jacket; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Hardcover. Zustand: Very Good. 2nd ed. With dust jacket. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

hardcover. Zustand: Very Good. Springer November 1981.

PAPERBACK. Paperback edition. 11pp, staplebound octavo. light crease and mild cover wear, tight binding, clean throughout, Very Good-. Eric von Schmidt (illustrator).

hardcover. Zustand: Very Good. 3rd. Third Edition; 2003. Glossy paper covers; minimal wear; stain on top edge, otherwise like new condition; 4to - over 9 3/4" to 12" tall; no jacket. Interior is bright, clean and unmarked; 690 pages. Additional shipping charges may be required due to the size and weight of book.…

hardcover. Zustand: Very Good. Cover and edges may have some wear.

Zustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:9783527296576. …

Hardcover. Zustand: Gut. 775 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. 3527282653 Sprache: Englisch Gewicht in Gramm: 550.

Softcover. Zustand: Fine. First Edition. Magazine. 16mo. String bound illustrated stiff paper wrappers. Fine. Poetry anthology with contributions from John Updike, Lyn Lifshin, Leonard Nathan, Virginia Brady Young, Raymond Roseliep, Carolyn Maisel, Roger Pfingston, William Matthews, Mary Azrael, Greg Kuzma, Judith Moffett, Harold Tinkle, Ann Deagon, Conrad Hilberry, Sheila Nickerson, Barry Spacks, William Jon Watkins, Robert Stock, Andrew Glaze, Ruth Daigon, ERic Torgersen, Lillian Morrison, Rafael Jesus Gonzalez, and Monica Raymond. …

Gr.-8°, gebundene Ausgabe. Zustand: Sehr gut. 775, [18] Seiten : mit Abbildungen : Ausgesondertes Bibliotheksexemplar mit den zugehörigen Kennzeichnungen, Bibliotheksaufkleber auf Buchrücken, Stempel auf Titelseite, Aufkleber, Stempel und RFID-Chip im Nachsatz, ansonsten in sehr gutem Zustand und nur sehr minimal lichtrandig B05-02-01Z Sprache: Englisch Gewicht in Gramm: 1538.…

Paperback. Zustand: New. Third Edition 2003. In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and "through-the-lens" detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.…

Zustand: New.

Zustand: New.

paperback. Zustand: New. In shrink wrap. Looks like an interesting title.

Paperback. Zustand: New. Third Edition 2003. In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The ?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and "through-the-lens" detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.…

Zustand: gut. 1994. Materials Science and Technology - Volume 2B: Characterization of Materials Part II In deutscher Sprache. pages.