Kingon angus (8 Ergebnisse)
Sprache: Englisch
Verlag: Springer, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Buch 147 von 241. Buch 147 von 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Hardcover
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections
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Zustand: New. In.
Sprache: Englisch
Verlag: Springer, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Buch 147 von 241. Buch 147 von 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Softcover
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes KönigreichRia Christie Collections
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Zustand: New. In.
Sprache: Englisch
Verlag: Springer, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Buch 147 von 241. Buch 147 von 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Hardcover
Anbieter: Majestic Books, Hounslow, Vereinigtes KönigreichMajestic Books
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EUR 375,57
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Zustand: New. pp. 528 Illus.
Sprache: Englisch
Verlag: Springer Netherlands, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Buch 147 von 241. Buch 147 von 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Hardcover
Anbieter: moluna, Greven, Deutschlandmoluna
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EUR 336,82
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Gebunden. Zustand: New. As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming.
Sprache: Englisch
Verlag: Springer Netherlands, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Buch 147 von 241. Buch 147 von 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Softcover
Anbieter: moluna, Greven, Deutschlandmoluna
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EUR 337,57
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Kartoniert / Broschiert. Zustand: New. As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming.
Scanning Probe Microscopy: Characterization, Nanofabricatoin And Device Application of Functional Materials
Vilarinho, Paula Maria (Editor)/ Rosenwaks, Yossi (Editor)/ Kingon, Angus I. (Editor)
Sprache: Englisch
Verlag: Kluwer Academic Pub, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Buch 147 von 241. Buch 147 von 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Softcover
Anbieter: Revaluation Books, Exeter, Vereinigtes KönigreichRevaluation Books
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Paperback. Zustand: Brand New. 1st edition. 488 pages. 9.25x6.25x1.25 inches. In Stock.
Sprache: Englisch
Verlag: Springer Feb 2005, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Buch 147 von 241. Buch 147 von 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Softcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
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EUR 416,17
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Taschenbuch. Zustand: Neu. Neuware - As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key r…ole in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
Sprache: Englisch
Verlag: Springer Nature B.V. Mär 2005, 2005
Serie: NATO Science Series II: Mathematics, Physics and Chemistry, Buch 147 von 241. Buch 147 von 241 - NATO Science Series II: Mathematics, Physics and Chemistry
- Hardcover
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
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EUR 474,63
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Buch. Zustand: Neu. Neuware - As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in…nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
