Verlag: Springer, 1986
ISBN 10: 0306423871 ISBN 13: 9780306423871
Zustand: Good. Good condition. A copy that has been read but remains intact. May contain markings such as bookplates, stamps, limited notes and highlighting, or a few light stains.
Verlag: Springer, 1986
ISBN 10: 0306423871 ISBN 13: 9780306423871
Anbieter: Better World Books, Mishawaka, IN, USA
Zustand: Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
Verlag: Plenum Press, 1986
ISBN 10: 0306423871 ISBN 13: 9780306423871
Anbieter: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Deutschland
gebundene Ausgabe. Zustand: Gut. 448 Seiten Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sehr sauber. Es befindet sich neben dem Rückenschild lediglich ein Bibliotheksstempel im Buch; ordnungsgemäß entwidmet. Einbandkanten sind leicht bestoßen. Leichte altersbedingte Anbräunung des Papiers. In ENGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 1005.
Verlag: Springer US, 1990
ISBN 10: 0306435918 ISBN 13: 9780306435911
Anbieter: Buchpark, Trebbin, Deutschland
Zustand: Gut. Zustand: Gut - Gebrauchs- und Lagerspuren. Außen: verschmutzt. | Seiten: 424 | Sprache: Englisch | Produktart: Bücher.
Verlag: Springer US, 2011
ISBN 10: 1461276535 ISBN 13: 9781461276531
Anbieter: moluna, Greven, Deutschland
Zustand: New.
Verlag: Springer US, 1986
ISBN 10: 0306423871 ISBN 13: 9780306423871
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the 'physics of the processes' and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.
Verlag: Springer US, 2013
ISBN 10: 1489920390 ISBN 13: 9781489920393
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the 'physics of the processes' and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.