Eckstein rainer (12 Ergebnisse)

Softcover. Zustand: Fine. Leichte Gebrauchsspuren; Leichte Verschmutzung / Farbtonveränderung.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: Used. pp. xviii + 508.

Taschenbuch. Zustand: Neu. Sputtering by Particle Bombardment | Experiments and Computer Calculations from Threshold to MeV Energies | Rainer Behrisch (u. a.) | Taschenbuch | Topics in Applied Physics | xvii | Englisch | 2010 | Springer | EAN 9783642079443 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Zustand: New. In English.

Zustand: New. In English.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Earlier books on this subject, i.e. 'Sputtering by Particle Bombardment I - III' are nearly 20 years old, but since then a lot of new and important work has been performed and published in international journals. The planned book brings an overview about all the new results. This concerns especially a new summary of the measured and calculated sputtering yields with an algebraic approximation formula for the energy and angular dependence of the yields. This is especially useful for all colleagues, who need sputtering yields for physics and/or applied problems. The computational methods for calculating sputtering yields are critically reviewed, Molecular dynamics calculations have not been covered in the previous books on sputtering. The influence of chemical effects on sputtering and the new models developed in the last years for understanding these effects, such as for hydrogen ion bombardment of carbon, are outlined. New developments, such as sputtering by MeV Ions and the mechanisms for understanding the effects are presented. The new results about the angular and energy distributions of sputtered atoms are presented in an extra chapter.…

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Earlier books on this subject, i.e. 'Sputtering by Particle Bombardment I - III' are nearly 20 years old, but since then a lot of new and important work has been performed and published in international journals. The planned book brings an overview about all the new results. This concerns especially a new summary of the measured and calculated sputtering yields with an algebraic approximation formula for the energy and angular dependence of the yields. This is especially useful for all colleagues, who need sputtering yields for physics and/or applied problems. The computational methods for calculating sputtering yields are critically reviewed, Molecular dynamics calculations have not been covered in the previous books on sputtering. The influence of chemical effects on sputtering and the new models developed in the last years for understanding these effects, such as for hydrogen ion bombardment of carbon, are outlined. New developments, such as sputtering by MeV Ions and the mechanisms for understanding the effects are presented. The new results about the angular and energy distributions of sputtered atoms are presented in an extra chapter.…

Paperback. Zustand: Brand New. 508 pages. 8.90x6.10x1.20 inches. In Stock.

Kartoniert. 23,0 x 16,0 cm. 20 Seiten, 2 CD-ROM. Originalkarton. - Einband etwas angestaubt. Versandhinweis: Die Versandkostenpauschalen basieren auf Sendungen mit einem durchschnittlichen Gewicht. Falls das von Ihnen bestellte Buch besonders schwer oder sperrig sein sollte, werden wir Sie informieren, falls zusätzliche Versandkosten anfallen.…

Hardcover. Zustand: Sehr gut. 159 Seiten Ein praktisches Handbuch, das den Einstieg in die Computerwelt erleichtert und grundlegendes Wissen verständlich vermittelt. Zustand: Einband mit geringfügigen Gebrauchsspuren, insgesamt SEHR GUTER Zustand! HC1-434-1/8-00538670 Sprache: Deutsch Gewicht in Gramm: 851.…

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 328 | Sprache: Deutsch | Produktart: Bücher | Keine Beschreibung verfügbar.