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gebundene Ausgabe. Zustand: Gut. 128 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 400.

Zustand: New. pp. 202 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

hardcover. Zustand: Very Good. Zustand des Schutzumschlags: No dust jacket. Blue hardcover with yellow and white lettering on spine and upper board and contents in very good clean condition, showing minimal signs of wear. Previous owner's name on FEP. Profusely illustrated by diagrams. No dust jacket. T. Used.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.

Zustand: New. pp. 544.

Zustand: New. pp. xxviii + 403 Illus.

Hardcover. Zustand: Brand New. illustrated edition. 536 pages. 9.50x8.00x1.50 inches. In Stock.

Hardcover. Zustand: Brand New. illustrated edition. 432 pages. 9.25x7.50x1.00 inches. In Stock.

Hardcover. Zustand: Brand New. 621 pages. 9.25x6.10x1.61 inches. In Stock.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Buch. Zustand: Neu. Neuware -This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today¿s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 624 pp. Englisch.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Validation of programmable architectures, consisting of processor cores, coprocessors, and memory subsystems, is one of the major bottlenecks in current System-on-Chip design methodology. A critical challenge in validation of such systems is the lack of a golden reference model. As a result, many existing validation techniques employ a bottom-up approach to design verification, where the functionality of an existing architecture is, in essence, reverse-engineered from its implementation. Traditional validation techniques employ different reference models depending on the abstraction level and verification task, resulting in potential inconsistencies between multiple reference models.This book presents a top-down validation methodology that complements the existing bottom-up approaches. It leverages the system architect's knowledge about the behavior of the design through architecture specification using an Architecture Description Language (ADL). The authors also address two fundamental challenges in functional verification: lack of a golden reference model, and lack of a comprehensive functional coverage metric. Functional Verification of Programmable Embedded Architectures: A Top-Down Approach is designed for students, researchers, CAD tool developers, designers, and managers interested in the development of tools, techniques and methodologies for system-level design, microprocessor validation, design space exploration and functional verification of embedded systems.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 376 | Sprache: Englisch | Produktart: Bücher | Research on high-level synthesis started over twenty years ago, but lower-level tools were not available to seriously support the insertion of high-level synthesis into the mainstream design methodology. Since then, substantial progress has been made in formulating and understanding the basic concepts in high-level synthesis. Although many open problems remain, high-level synthesis has matured. High-Level Synthesis: Introduction to Chip and System Design presents a summary of the basic concepts and results and defines the remaining open problems. This is the first textbook on high-level synthesis and includes the basic concepts, the main algorithms used in high-level synthesis and a discussion of the requirements and essential issues for high-level synthesis systems and environments. A reference text like this will allow the high-level synthesis community to grow and prosper in the future.

Zustand: very good. Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.

Zustand: New.

Zustand: Hervorragend. Zustand: Hervorragend | Seiten: 624 | Sprache: Englisch | Produktart: Bücher | This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today¿s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc.Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems;Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers;Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems.

Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Memory Issues in Embedded Systems-On-Chip: Optimizations and Explorations is designed for different groups in the embedded systems-on-chip arena. First, it is designed for researchers and graduate students who wish to understand the research issues involved in memory system optimization and exploration for embedded systems-on-chip. Second, it is intended for designers of embedded systems who are migrating from a traditional micro-controllers centered, board-based design methodology to newer design methodologies using IP blocks for processor-core-based embedded systems-on-chip. Also, since Memory Issues in Embedded Systems-on-Chip: Optimization and Explorations illustrates a methodology for optimizing and exploring the memory configuration of embedded systems-on-chip, it is intended for managers and system designers who may be interested in the emerging capabilities of embedded systems-on-chip design methodologies for memory-intensive applications.

Zustand: New. pp. 268 Illus.

Zustand: New. Num Pages: 188 pages, biography. BIC Classification: THR; TJFC; UGC. Category: (G) General (US: Trade). Dimension: 235 x 155 x 11. Weight in Grams: 332. . 1998. Softcover reprint of the original 1st ed. 1999. Paperback. . . . . Books ship from the US and Ireland.

Zustand: New. 2010. Paperback. . . . . . Books ship from the US and Ireland.

Zustand: New. Presents a top-down validation methodology that complements the existing bottom-up approaches. This work addresses two fundamental challenges in functional verification: lack of a golden reference model, and lack of a comprehensive functional coverage metric. It is designed for students, researchers, CAD tool developers, designers, and managers. Num Pages: 180 pages, biography. BIC Classification: UYF. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 12. Weight in Grams: 1020. . 2005. Hardback. . . . . Books ship from the US and Ireland.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - It is widely acknowledged that the cost of validation and testing comprises a s- nificant percentage of the overall development costs for electronic systems today, and is expected to escalate sharply in the future. Many studies have shown that up to 70% of the design development time and resources are spent on functional verification. Functional errors manifest themselves very early in the design flow, and unless they are detected up front, they can result in severe consequence- both financially and from a safety viewpoint. Indeed, several recent instances of high-profile functional errors (e. g. , the Pentium FDIV bug) have resulted in - creased attention paid to verifying the functional correctness of designs. Recent efforts have proposed augmenting the traditional RTL simulation-based validation methodology with formal techniques in an attempt to uncover hard-to-find c- ner cases, with the goal of trying to reach RTL functional verification closure. However, what is often not highlighted is the fact that in spite of the tremendous time and effort put into such efforts at the RTL and lower levels of abstraction, the complexity of contemporary embedded systems makes it difficult to guarantee functional correctness at the system level under all possible operational scenarios. The problem is exacerbated in current System-on-Chip (SOC) design meth- ologies that employ Intellectual Property (IP) blocks composed of processor cores, coprocessors, and memory subsystems. Functional verification becomes one of the major bottlenecks in the design of such systems.

Gebunden. Zustand: New. Includes the latest studies/statistics on both verification complexity and design failuresProvides a complete view of the existing specification languages for programmable architecturesDemonstrates the development of functional fault models.

Taschenbuch. Zustand: Neu. Neuware.

Zustand: Sehr gut. Zustand: Sehr gut | Seiten: 264 | Sprache: Englisch | Produktart: Bücher | Rapid advances in microelectronic integration and the advent of Systems-on-Chip have fueled the need for high-level synthesis, i.e., an automated approach to the synthesis of hardware from behavioral descriptions. SPARK: A Parallelizing Approach to the High - Level Synthesis of Digital Circuits presents a novel approach to the high-level synthesis of digital circuits -- that of parallelizing high-level synthesis (PHLS). This approach uses aggressive code parallelizing and code motion techniques to discover circuit optimization opportunities beyond what is possible with traditional high-level synthesis. This PHLS approach addresses the problems of the poor quality of synthesis results and the lack of controllability over the transformations applied during the high-level synthesis of system descriptions with complex control flows, that is, with nested conditionals and loops. Also described are speculative code motion techniques and dynamic compiler transformations that optimize the circuit quality in terms of cycle time, circuit size and interconnect costs. We describe the SPARK parallelizing high-level synthesis framework in which we have implemented these techniques and demonstrate the utility of SPARK's PHLS approach using designs derived from multimedia and image processing applications. We also present a case study of an instruction length decoder derived from the Intel Pentium-class of microprocessors. This case study serves as an example of a typical microprocessor functional block with complex control flow and demonstrates how our techniques are useful for such designs. SPARK: A Parallelizing Approach to the High - Level Synthesis of Digital Circuits is targeted mainly to embedded system designers and researchers. This includes people working on design and design automation. The book is useful for researchers and design automation engineers who wish to understand how the main problems hindering the adoption of high-level synthesis among designers.