devroye luc (37 Ergebnisse)

Zustand: Good. Birkhauser, 1986. Cover rubbed/bumped, lightly soiled, corners/edges/spine ends lightly rubbed/bumped, spine quite sunned; very light pencil erasures at ffep; binding tight; edges and interior intact and clean, except where noted. hardcover. Good.

Zustand: Good. Birkhauser, 1986. Cover very lightly rubbed/bumped; edges lightly soiled; pastedowns/endpapers faintly soiled; binding tight; cover and interior intact and clean, except where noted. hardcover. Good.

XII, 235 P. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Sprache: Englisch.

gebundene Ausgabe. Zustand: Gut. 146 Seiten; graph. Darst. ; Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sehr sauber. Es befindet sich neben dem Rückenschild lediglich ein Bibliotheksstempel im Buch; ordnungsgemäß entwidmet. In ENGLISCHER Sprache. Sprache: Englisch Gewicht in Gramm: 400.

Hardcover. Zustand: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Zustand: New. pp. 248 Illus.

Zustand: New. pp. 160 23:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on White w/Gloss Lam.

Hardcover. Zustand: Brand New. 155 pages. 8.90x5.90x0.50 inches. In Stock.

Hardcover. Zustand: Brand New. 235 pages. 9.50x6.50x0.50 inches. In Stock.

Hardcover. Zustand: Good. No Jacket. Former library book; Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 3.1.

Kartoniert, 8°, 146 Seiten, das Buch befindet sich in einem guten Zustand. Shipping to abroad insured with tracking number.

Buch. Zustand: Neu. Neuware -This book is devoted to Professor Jürgen Lehn, who passed away on September 29, 2008, at the age of 67. It contains invited papers that were presented at the Wo- shop on Recent Developments in Applied Probability and Statistics Dedicated to the Memory of Professor Jürgen Lehn, Middle East Technical University (METU), Ankara, April 23¿24, 2009, which was jointly organized by the Technische Univ- sität Darmstadt (TUD) and METU. The papers present surveys on recent devel- ments in the area of applied probability and statistics. In addition, papers from the Panel Discussion: Impact of Mathematics in Science, Technology and Economics are included. Jürgen Lehn was born on the 28th of April, 1941 in Karlsruhe. From 1961 to 1968 he studied mathematics in Freiburg and Karlsruhe, and obtained a Diploma in Mathematics from the University of Karlsruhe in 1968. He obtained his Ph.D. at the University of Regensburg in 1972, and his Habilitation at the University of Karlsruhe in 1978. Later in 1978, he became a C3 level professor of Mathematical Statistics at the University of Marburg. In 1980 he was promoted to a C4 level professorship in mathematics at the TUD where he was a researcher until his death.Physica Verlag, Tiergartenstr. 17, 69121 Heidelberg 248 pp. Englisch.

Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | This book is devoted to Professor Jürgen Lehn, who passed away on September 29, 2008, at the age of 67. It contains invited papers that were presented at the Wo- shop on Recent Developments in Applied Probability and Statistics Dedicated to the Memory of Professor Jürgen Lehn, Middle East Technical University (METU), Ankara, April 23¿24, 2009, which was jointly organized by the Technische Univ- sität Darmstadt (TUD) and METU. The papers present surveys on recent devel- ments in the area of applied probability and statistics. In addition, papers from the Panel Discussion: Impact of Mathematics in Science, Technology and Economics are included. Jürgen Lehn was born on the 28th of April, 1941 in Karlsruhe. From 1961 to 1968 he studied mathematics in Freiburg and Karlsruhe, and obtained a Diploma in Mathematics from the University of Karlsruhe in 1968. He obtained his Ph.D. at the University of Regensburg in 1972, and his Habilitation at the University of Karlsruhe in 1978. Later in 1978, he became a C3 level professor of Mathematical Statistics at the University of Marburg. In 1980 he was promoted to a C4 level professorship in mathematics at the TUD where he was a researcher until his death.

Taschenbuch. Zustand: Neu. Recent Developments in Applied Probability and Statistics | Dedicated to the Memory of Jürgen Lehn | Luc Devroye (u. a.) | Taschenbuch | xii | Englisch | 2014 | Physica | EAN 9783790829105 | Verantwortliche Person für die EU: Physica Verlag in Springer Science + Business Media, Tiergartenstr. 15-17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Zustand: New. pp. 660 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

Hardcover. Octavo, xi, 356 pages. In Very Good condition with a Very Good minus dust jacket. Spine is green with white print. Dust jacket has age toning overall, vendor label on rear panel. Boards in blue cloth with green banner, gold print. NOTE: Shelved in Locked Annex Area, ND-HV Section. 1396969. FP New Rockville Stock.

Zustand: Sehr gut. 636 Seiten Zustand: Einband etwas berieben, Name auf fliegendem Vorsatzblatt // Mit 99 Abbildungen. Englische Ausgabe /// Versand gratis Innerhalb Deutschlands - Portofrei in Deutschland- ab 20 Euro mit Post ID - Gratisversand deutschlandweit innerhalb Deutschlands gratis Versand -Versandkostenfrei innerhalb Deutschlands /// Sprache: Englisch Gewicht in Gramm: 1030 24,5 x 16,0 cm, Hardcover/Pappeinband.

Paperback. Zustand: Brand New. reprint edition. 653 pages. 9.25x6.10x1.42 inches. In Stock.

Taschenbuch. Zustand: Neu. A Probabilistic Theory of Pattern Recognition | Luc Devroye (u. a.) | Taschenbuch | xv | Englisch | 2013 | Springer | EAN 9781461268772 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Zustand: Neu. Neuware -Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 660 pp. Englisch.

Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.

Zustand: New.

Gebunden. Zustand: New.

Buch. Zustand: Neu. Neuware -Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 660 pp. Englisch.

Taschenbuch. Zustand: Neu. Non-Uniform Random Variate Generation | Luc Devroye | Taschenbuch | xvi | Englisch | 2013 | Springer New York | EAN 9781461386452 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Zustand: Neu. Neuware -This text presents a wide-ranging and rigorous overview of nearest neighbor methods, one of the most important paradigms in machine learning. Now in one self-contained volume, this book systematically covers key statistical, probabilistic, combinatorial and geometric ideas for understanding, analyzing and developing nearest neighbor methods.Gérard Biau is a professor at Université Pierre et Marie Curie (Paris). Luc Devroye is a professor at the School of Computer Science at McGill University (Montreal).Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 300 pp. Englisch.

Taschenbuch. Zustand: Neu. Neuware -Thls text ls about one small fteld on the crossroads of statlstlcs, operatlons research and computer sclence. Statistleians need random number generators to test and compare estlmators before uslng them ln real l!fe. In operatlons research, random numbers are a key component ln !arge scale slmulatlons. Computer sclen tlsts need randomness ln program testlng, game playlng and comparlsons of algo rlthms. The appl!catlons are wlde and varled. Yet all depend upon the same com puter generated random numbers. Usually, the randomness demanded by an appl!catlon has some bullt-ln structure: typlcally, one needs more than just a sequence of Independent random blts or Independent uniform [0,1] random vari ables. Some users need random variables wlth unusual densltles, or random com blnatorlal objects wlth speclftc propertles, or random geometrlc objects, or ran dom processes wlth weil deftned dependence structures. Thls ls preclsely the sub ject area of the book, the study of non-uniform random varlates. The plot evolves around the expected complexlty of random varlate genera tlon algorlthms. We set up an ldeal!zed computatlonal model (wlthout overdolng lt), we lntroduce the notlon of unlformly bounded expected complexlty, and we study upper and lower bounds for computatlonal complexlty. In short, a touch of computer sclence ls added to the fteld. To keep everythlng abstract, no tlmlngs or computer programs are lncluded. Thls was a Iabor of Iove. George Marsagl!a created CS690, a course on ran dom number generat!on at the School of Computer Sclence of McG!ll Unlverslty.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 860 pp. Englisch.

Buch. Zustand: Neu. Neuware -This text presents a wide-ranging and rigorous overview of nearest neighbor methods, one of the most important paradigms in machine learning. Now in one self-contained volume, this book systematically covers key statistical, probabilistic, combinatorial and geometric ideas for understanding, analyzing and developing nearest neighbor methods.Gérard Biau is a professor at Université Pierre et Marie Curie (Paris). Luc Devroye is a professor at the School of Computer Science at McGill University (Montreal).Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 300 pp. Englisch.

Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.