EUR 3,38
Anzahl: 1 verfügbar
In den WarenkorbHardcover. Zustand: Moyen. Ancien livre de bibliothèque. Traces d'usure sur la couverture. Edition 1986. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Acceptable. Former library book. Signs of wear on the cover. Edition 1986. Ammareal gives back up to 15% of this item's net price to charity organizations.
Verlag: Purdue University / I.P.R. Associates West-Lafayette / State College, IN / PA, 1969
Anbieter: Specific Object / David Platzker, New York, NY, USA
327 pp.; 22.2 x 15.1 cm.; sewn bound; black-and-white; edition size unknown; unsigned and unnumbered; offset-printed; May 1969 issue of Man and World edited by Joseph M. Anderson, Joseph J. Kockelmans and Calvin O. Schrag. Contents includes: "The Grounds of Ethical Universality in Aristotle," by Joseph Owens; "Die Welt der Instituitionen. Ihre philosophischen Grundaspekte," by Amadeo Silva-Tarouca; "Worlds and World Views," by Stephen A. Erickson; "Alienation and the Status Quo," by Joseph C. Flay; "Ist die klassische Logik im leeren Individuenbereich gültig?," by K. Berka; "Privacy," by Robert Ehman; "La filosofia e la metodologia della scienza oggi in Italia," by Vittorio Somenzi; "Vers une philosophie de la psychose," by W. Ver Eecke; Book reviews: Lev Shestov on "Athens and Jerusalem" by Edward G. Ballard and Paul Ricoeur on "Freedom and Nature. The Voluntary and the Involuntary," by Robert R. Ehman and "Chronicles." Good. 2 cm. of soiling to recto with significant rubbing of cover edges and bumping of corners. 10.2 cm. of yellow soiling to inside of recto. Soiling and yellow discoloration of verso. Light bumping of page edges with 1.1 cm. of soiling to endpaper. Contents otherwise clean and unmarked.
Anbieter: Ria Christie Collections, Uxbridge, Vereinigtes Königreich
EUR 141,38
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In den WarenkorbZustand: New. In.
EUR 157,81
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In den WarenkorbZustand: New. Inhaltsverzeichnis1. Introduction. 2. Characterization of Filters. 3. Approximation of the Transfer Function. 4. Active RC Synthesis. 5. Sensitivity and Tolerances. 6. Active RC Filter Sections. 7. Design Optimization and Manufactu.