Verlag: Institution of Engineering and T, 2006
ISBN 10: 0863415520 ISBN 13: 9780863415524
Sprache: Englisch
Anbieter: Books From California, Simi Valley, CA, USA
Hardcover. Zustand: Fine. Sealed in original plastic with major tearing.
Verlag: Institution Of Engineering And Technology, 2006
ISBN 10: 0863415520 ISBN 13: 9780863415524
Sprache: Englisch
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
EUR 11,06
Anzahl: 1 verfügbar
In den WarenkorbZustand: Good. Volume 18. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1550grams, ISBN:9780863415524.
Verlag: Institution Of Engineering And Technology, 2006
ISBN 10: 0863415520 ISBN 13: 9780863415524
Sprache: Englisch
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
EUR 11,90
Anzahl: 1 verfügbar
In den WarenkorbZustand: Fair. Volume 18. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1550grams, ISBN:9780863415524.
Verlag: Institution Of Engineering And Technology, 2006
ISBN 10: 0863415520 ISBN 13: 9780863415524
Sprache: Englisch
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
EUR 16,08
Anzahl: 1 verfügbar
In den WarenkorbZustand: Good. Volume 18. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1550grams, ISBN:9780863415524.
Anbieter: Better World Books, Mishawaka, IN, USA
Zustand: Very Good. Former library book; may include library markings. Used book that is in excellent condition. May show signs of wear or have minor defects.
Anbieter: Zubal-Books, Since 1961, Cleveland, OH, USA
Zustand: Good. 178 pp., Hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
Verlag: Institution Of Engineering And Technology, 2006
ISBN 10: 0863415520 ISBN 13: 9780863415524
Sprache: Englisch
Anbieter: Anybook.com, Lincoln, Vereinigtes Königreich
EUR 31,75
Anzahl: 1 verfügbar
In den WarenkorbZustand: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings With owner's name inside cover. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1550grams, ISBN:9780863415524.
Verlag: The Institution of Electrical Engineers, London, 2006
Anbieter: PsychoBabel & Skoob Books, Didcot, Vereinigtes Königreich
EUR 40,21
Anzahl: 1 verfügbar
In den Warenkorbhardcover. Zustand: Very Good. Zustand des Schutzumschlags: No Dust Jacket. Hard cover with no jacket. Book is in very good condition. Very light wear in a few places at edges and corners. Previous owner's name to FEP. Thin mark vertically down inside of cover. Contents are otherwise clean, bright and tight. J. Used.
Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA
Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Anbieter: Majestic Books, Hounslow, Vereinigtes Königreich
EUR 129,36
Anzahl: 1 verfügbar
In den WarenkorbZustand: New. pp. 220 Illus.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 151,16
Anzahl: 2 verfügbar
In den WarenkorbPaperback. Zustand: Brand New. 180 pages. 9.25x6.10x0.44 inches. In Stock.
Anbieter: preigu, Osnabrück, Deutschland
Taschenbuch. Zustand: Neu. Power-Constrained Testing of VLSI Circuits | A Guide to the IEEE 1149.4 Test Standard | Bashir M. Al-Hashimi (u. a.) | Taschenbuch | xi | Englisch | 2010 | Springer US | EAN 9781441953155 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
Zustand: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
Anbieter: moluna, Greven, Deutschland
EUR 118,64
Anzahl: Mehr als 20 verfügbar
In den WarenkorbGebunden. Zustand: New. System-Level Design Techniques for Energy-Efficient Embedded Systems addresses the development and validation of co-synthesis techniques that allow an effective design of embedded systems with low energy dissipation. The book provides an overview of a syste.
Verlag: Kluwer Academic Publishers, 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
Sprache: Englisch
Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. Focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. This text surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths. Series: Frontiers in Electronic Testing. Num Pages: 189 pages, biography. BIC Classification: TJFD. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 297 x 210 x 12. Weight in Grams: 990. . 2003. Hardback. . . . . Books ship from the US and Ireland.
Verlag: Kluwer Academic Publishers, 2003
ISBN 10: 1402077505 ISBN 13: 9781402077500
Sprache: Englisch
Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. Addresses the development and validation of co-synthesis techniques that allow an effective design of embedded systems with low energy dissipation. This book provides an overview of a system-level co-design flow, illustrating how system performance is influenced at various steps of the flow including allocation, mapping, and scheduling. Num Pages: 194 pages, biography. BIC Classification: TJFD1. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 235 x 155 x 14. Weight in Grams: 1080. . 2003. Hardback. . . . . Books ship from the US and Ireland.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density.Power-Constrained Testing of VLSI Circuits focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented.
Verlag: Springer US, Springer New York, 2003
ISBN 10: 140207235X ISBN 13: 9781402072352
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density.Power-Constrained Testing of VLSI Circuits focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented.
Verlag: INSTITUTION OF ENGINEERING & T, 2006
ISBN 10: 0863415520 ISBN 13: 9780863415524
Sprache: Englisch
Anbieter: moluna, Greven, Deutschland
EUR 158,51
Anzahl: Mehr als 20 verfügbar
In den WarenkorbZustand: New. Über den AutorBashir M Al-Hashimi is Professor of Computing Engineering at the School of Electronics and Computer Science, University of Southampton, UK.Inhaltsverzeichnisrnrnn Part 1: System-level design.
Verlag: Inst of Engineering & Technology, 2019
ISBN 10: 1785615823 ISBN 13: 9781785615825
Sprache: Englisch
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 200,33
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 650 pages. 9.21x6.14x1.38 inches. In Stock.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 225,98
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. illustrated edition. 944 pages. 9.25x6.50x2.25 inches. In Stock.
Verlag: INSTITUTION OF ENGINEERING & T, 2019
ISBN 10: 1785615823 ISBN 13: 9781785615825
Sprache: Englisch
Anbieter: moluna, Greven, Deutschland
EUR 187,94
Anzahl: Mehr als 20 verfügbar
In den WarenkorbGebunden. Zustand: New. Inhaltsverzeichnisrnrnn Part I: Programming models, OS and applicationsn Chapter 1: HPC with many core processorsn Chapter 2: From irregular heterogeneous software to reconfigurable hardwaren Chapter 3: Operatin.
Verlag: Institution of Engineering & Technology, 2006
ISBN 10: 0863415520 ISBN 13: 9780863415524
Sprache: Englisch
Anbieter: preigu, Osnabrück, Deutschland
Buch. Zustand: Neu. System-On-Chip: Next Generation Electronics | Bashir M. Al-Hashimi | Buch | Materials, Circuits and Device | Gebunden | Englisch | 2006 | Institution of Engineering & Technology | EAN 9780863415524 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu.
Verlag: INSTITUTION OF ENGINEERING & T, 2019
ISBN 10: 1785615823 ISBN 13: 9781785615825
Sprache: Englisch
Anbieter: Buchpark, Trebbin, Deutschland
Zustand: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher.
Verlag: Institution Of Engineering & Technology Jan 2006, 2006
ISBN 10: 0863415520 ISBN 13: 9780863415524
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - This book highlights both the key achievements of electronic systems design targeting SoC implementation style, and the future challenges presented by the continuing scaling of CMOS technology.
EUR 217,92
Anzahl: Mehr als 20 verfügbar
In den WarenkorbGebunden. Zustand: New. Al-Hashimi, BashirThis comprehensive volume covers both elementary and advanced analog and digital circuit simulation using PSpice. The text includes many worked examples, circuit diagrams, tables, and code listings. It also compares practical results w.
Verlag: Institution of Engineering & Technology, 2019
ISBN 10: 1785615823 ISBN 13: 9781785615825
Sprache: Englisch
Anbieter: preigu, Osnabrück, Deutschland
Buch. Zustand: Neu. Many-Core Computing: Hardware and Software | Bashir M. Al-Hashimi (u. a.) | Buch | Computing and Networks | Gebunden | Englisch | 2019 | Institution of Engineering & Technology | EAN 9781785615825 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu.
Verlag: Institution Of Engineering & Technology Jul 2019, 2019
ISBN 10: 1785615823 ISBN 13: 9781785615825
Sprache: Englisch
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - The primary aim of this book is to provide a timely and coherent account of the recent advances in many-core computing research. Starting with programming models, operating systems and their applications; it presents runtime management techniques, followed by system modelling, verification and testing methods, and architectures and systems.
Anbieter: AHA-BUCH GmbH, Einbeck, Deutschland
Buch. Zustand: Neu. Neuware - This comprehensive volume covers both elementary and advanced analog and digital circuit simulation using PSpice. The text includes many worked examples, circuit diagrams, tables, and code listings. It also compares practical results with those obtained from simulation.
Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
EUR 383,78
Anzahl: 2 verfügbar
In den WarenkorbHardcover. Zustand: Brand New. 624 pages. 11.02x8.66x2.76 inches. In Stock.