Verlag: LAP LAMBERT Academic Publishing, 2020
ISBN 10: 6202797614 ISBN 13: 9786202797610
Sprache: Englisch
Anbieter: moluna, Greven, Deutschland
EUR 24,56
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In den WarenkorbZustand: New.
Verlag: LAP LAMBERT Academic Publishing Aug 2020, 2020
ISBN 10: 6202797614 ISBN 13: 9786202797610
Sprache: Englisch
Anbieter: buchversandmimpf2000, Emtmannsberg, BAYE, Deutschland
Taschenbuch. Zustand: Neu. Neuware -Here in this book, we focus on the advanced, effective and widely used microscopic technique available for detection of morphological characterizations of materials. The principal objective is to provide a concise reading material on both practical and theoretical description of the techniques used to characterize a wide variety of materials. We discussed on the fundamental understanding, basic instrumentation, experimental strategy, analyses, and application part related to the scanning electron microscopy as well as transmission electron microscopy.Books on Demand GmbH, Überseering 33, 22297 Hamburg 68 pp. Englisch.
Verlag: LAP LAMBERT Academic Publishing, 2020
ISBN 10: 6202797614 ISBN 13: 9786202797610
Sprache: Englisch
Anbieter: preigu, Osnabrück, Deutschland
Taschenbuch. Zustand: Neu. Microscopic Characterization Techniques | Scanning Electron Microscopy and Transmission Electron Microscopy | Ajeet Appasaheb Yelwande (u. a.) | Taschenbuch | Englisch | 2020 | LAP LAMBERT Academic Publishing | EAN 9786202797610 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.