Structural Dynamics of Electronic and Photonic Systems

Ephraim Suhir

ISBN 10: 047025002X ISBN 13: 9780470250020
Verlag: Wiley Mai 2011, 2011
Neu Buch

Verkäufer AHA-BUCH GmbH, Einbeck, Deutschland Verkäuferbewertung 5 von 5 Sternen 5 Sterne, Erfahren Sie mehr über Verkäufer-Bewertungen

AbeBooks-Verkäufer seit 14. August 2006


Beschreibung

Beschreibung:

Neuware - The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro and opto electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high level dynamic loading. Particular attention will be given to portable devices and systems designed for operation in harsh environments (such as automotive, aerospace, military, etc.) In depth discussion from a mechanical engineer s viewpoint will be conducted to the key components' level as well as the whole device level. Both theoretical (analytical and computer aided) and experimental methods of analysis will be addressed. The authors will identify how the failure control parameters (e.g. displacement, strain and stress) of the vulnerable components may be affected by the external vibration or shock loading, as well as by the internal parameters of the infrastructure of the device. Guidelines for material selection, effective protection and test methods will be developed for engineering practice. Bestandsnummer des Verkäufers 9780470250020

Diesen Artikel melden

Inhaltsangabe:

The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading. Particular attention will be given to portable devices and systems designed for operation in harsh environments (such as automotive, aerospace, military, etc.)  In-depth discussion from a mechanical engineer's viewpoint will be conducted to the key components’ level as well as the whole device level. Both theoretical (analytical and computer-aided) and experimental methods of analysis will be addressed. The authors will identify how the failure control parameters (e.g. displacement, strain and stress) of the vulnerable components may be affected by the external vibration or shock loading, as well as by the internal parameters of the infrastructure of the device. Guidelines for material selection, effective protection and test methods will be developed for engineering practice.

Über die Autorin bzw. den Autor: Dr. EPHRAIM SUHIR is Fellow of the IEEE, ASME, APS, IoP (UK), and the SPE. He is Foreign Full Member (Academician) of the National Academy of Engineering, Ukraine; cofounder of the ASME Journal of Electronic Packaging; holds twenty-two U.S. patents; and has authored about 300 technical publications (papers, book chapters, books). Dr. Suhir has received many professional awards, including the 2004 ASME Worcester Read Warner Medal for outstanding contributions to the permanent literature of engineering; 2001 IMAPS John A. Wagnon Technical Achievement Award for outstanding contributions to the technical knowledge of the microelectronics, optoelectronics, and packaging industry; 2000 IEEE-CPMT Outstanding Sustained Technical Contribution Award; 2000 SPE International Engineering/Technology Award for contributions to plastics engineering; 1999 ASME Charles Russ Richards Memorial Award for contributions to mechanical engineering; and 1996 Bell Laboratories Distinguished Member of Technical Staff Award for developing engineering mechanics methods for predicting the reliability, performance, and mechanical behavior of complex structures.

DAVID S. STEINBERG is associated with the University of California, Los Angeles, Extension and also at the University of Wisconsin-Extension. He retired from Litton GCS (now Northrop Grumman) after serving as their director of engineering. He is the author of seven popular textbooks related to the design, analysis, testing, and evaluation of sophisticated electronic equipment for reliable operation in severe vibration, shock, thermal, thermal cycling, acoustic, and pyrotechnic shock environments. His most popular textbooks are Vibration Analysis for Electronic Equipment, Cooling Techniques for Electronic Equipment, and Preventing Thermal Cycling and Vibration Failures in Electronic Equipment, published by Wiley. Dr. Steinberg is currently the President of Steinberg & Associates and has presented seminars, workshops, and consulted for many of the major suppliers of electronics components and equipment such as General Electric, General Motors, Intel, Cisco, Texas Instruments, Microsoft, Harris, Honeywell, Raytheon, Westinghouse, and many others.

T. X. YU is Professor Emeritus of Mechanical Engineering at the Hong Kong University of Science and Technology (HKUST). After graduating from Peking University, he got his PhD and ScD from Cambridge University. After teaching at Peking University and UMIST, he joined HKUST in 1995. Before his retirement in July 2010, he was chair professor of mechanical engineering, associate vice-president (R&D), and dean of Fok Ying Tung Graduate School at HKUST. His research interests include impact dynamics, plasticity, energy absorption, textile and cellular materials, and nano-composites. He has published three textbooks, three scientific monographs, 310 journal papers, 170 international conference papers, and four patents. He serves as Associate Editor for the International Journal of Impact Engineering and International Journal of Mechanical Sciences. He is a Fellow of ASME, IMechE, and HKIE. 

„Über diesen Titel“ kann sich auf eine andere Ausgabe dieses Titels beziehen.

Bibliografische Details

Titel: Structural Dynamics of Electronic and ...
Verlag: Wiley Mai 2011
Erscheinungsdatum: 2011
Einband: Buch
Zustand: Neu

Beste Suchergebnisse beim ZVAB

Beispielbild für diese ISBN

Verlag: Wiley, 2011
ISBN 10: 047025002X ISBN 13: 9780470250020
Neu Hardcover

Anbieter: Romtrade Corp., STERLING HEIGHTS, MI, USA

Verkäuferbewertung 5 von 5 Sternen 5 Sterne, Erfahren Sie mehr über Verkäufer-Bewertungen

Zustand: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. Artikel-Nr. ABNR-302019

Verkäufer kontaktieren

Neu kaufen

EUR 139,27
Versand gratis
Versand innerhalb von USA

Anzahl: 1 verfügbar

In den Warenkorb

Beispielbild für diese ISBN

Suhir, Ephram
Verlag: John Wiley and Sons Ltd, 2011
ISBN 10: 047025002X ISBN 13: 9780470250020
Neu Hardcover

Anbieter: Kennys Bookstore, Olney, MD, USA

Verkäuferbewertung 4 von 5 Sternen 4 Sterne, Erfahren Sie mehr über Verkäufer-Bewertungen

Zustand: New. The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc. Editor(s): Suhir, Ephraim; Yu, T. X.; Steinberg, David S.; Connally, Eric. Num Pages: 608 pages, Illustrations. BIC Classification: TJF. Category: (P) Professional & Vocational. Dimension: 244 x 201 x 36. Weight in Grams: 1180. . 2011. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland. Artikel-Nr. V9780470250020

Verkäufer kontaktieren

Neu kaufen

EUR 275,02
EUR 9,02 Versand
Versand innerhalb von USA

Anzahl: 15 verfügbar

In den Warenkorb