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Titel: Power Integrity: Measuring, Optimizing, and ...

Verlag: McGraw Hill

Erscheinungsdatum: 2014

Einband: Hardcover

Zustand: Very Good

Zustand des Schutzumschlags: No Jacket

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PROVEN TECHNIQUES FOR GENERATING HIGH-FIDELITY MEASUREMENTS

Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems provides field-tested techniques for producing high-fidelity measurements using the appropriate equipment. The book thoroughly discusses measurement guidelines, test instrument selection and use, connecting the equipment to the device being tested, and interpreting the acquired data. The latest electronics technologies and their impact on measurement are discussed. Detailed photographs, screenshots, schematics, and equations are included throughout this practical guide.

Learn how to accurately measure:

Impedance
Stability
Power supply rejection ratio (PSRR)
Reverse transfer and crosstalk
Step load response
Ripple and noise
Edges
High-frequency impedance

�ber die Autorin bzw. den Autor:

Steven M. Sandler (Mesa, AZ) is currently a consultant to AEi Systems LLC, a power electronics firm he founded in 1995. He has developed and taught courses at Motorola University and has published many articles on power circuit modeling for PCIM, PEIN, and Intusoft Online. He holds a BSEE from Pacific Western University, and is the author of Spice3 SMPS Simulation.

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Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems

Steven M. Sandler

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Unternehmensdaten des Verk�ufers