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Bibliografische Details

Titel: Modeling and Characterization of RF and ...

Verlag: Cambridge University Press

Erscheinungsdatum: 2007

Einband: Hardcover

Zustand: Good

Zustand des Schutzumschlags: No Jacket

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Inhaltsangabe:

This 2007 book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples.

�ber die Autorin bzw. den Autor:

Peter H. Aaen is the Modeling Group Manager in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona. Jaime A. Pia is the Design Organization Manager in the RF Division at Freescale in the RF Division at Freescale Semiconductor, Inc., Tempe Arizona. John Wood is Senior Technical Contributor responsible for RF CAD and Modeling in the RF Division at Freescale Semiconductor, Inc., Tempe, Arizona. He is a Fellow of the IEEE.

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Modeling and Characterization of RF and Microwave Power FETs

Aaen, Peter; Plá, Jaime A.; Wood, John

Gebraucht - Hardcover

Unternehmensdaten des Verk�ufers