Microscopy of Semiconducting Materials : Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK. Dieser Artikel ist nicht verfügbar.
Sprache: Englisch
Verlag: Springer, Berlin, Springer, 2006
- Hardcover
- Neu
Anbieter: AHA-BUCH GmbH, Einbeck, DeutschlandAHA-BUCH GmbH
Verkäufer:in bei ZVAB seit 14. August 2006
Zustand: Neu
EUR 282,80
Artikelbeschreibung des Verkäufers
Neuware - Epitaxy: Wide Band-Gap Nitrides.- Epitaxy: Silicon-Germanium Alloys.- Epitaxy: Growth and Defect Phenomena.- High Resolution Microscopy and Nanoanalysis.- Self-Organised and Quantum Domain Structures.- Processed Silicon and Other Device Materials.- Device Studies.- Scanning Electron and Scanning Probe Advances.
Bestandsnummer des Verkäufers 9783540319146
- Titel
- Microscopy of Semiconducting Materials : Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
- Autor
- A.G. Cullis
- Verlag
- Springer, Berlin, Springer
- Erscheinungsjahr
- 2006
- Zustand
- Neu
- Einband
- Buch
- Sprache
- Englisch
- ISBN-10
- 354031914X
- ISBN-13
- 9783540319146
- Artikelgewicht
- 992 Gramm
- Abmessungen
- 241x160x35 mm
- Serie
- Buch 13 von 166: Springer Proceedings in Physics
This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14 th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.
„Inhaltsangabe“ gehört möglicherweise zu einer anderen Auflage dieses Titels.
Von der hinteren Coverseite
This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14 th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.
„Über diesen Titel“ gehört möglicherweise zu einer anderen Auflage dieses Titels.