535 pages in very good condition. Volume III, covering the year 1989. Pages are clean and unmarked with black and white illustrations throughout. Page edges are lightly smudged. Bound in yellow card covers with black titles. Some markings on the upper cover and spine. Spine is wrinkled. Lightly worn around the edges. VG Size: 8 1/2 x 11.

Bestandsnummer des Verk�ufers 232179

Verk�ufer kontaktieren

Diesen Artikel melden

Bibliografische Details

Titel

INTEGRATED CIRCUIT METROLOGY, INSPECTION, AND PROCESS CONTROL III

Verlag

SPIE - The International Society for Optical Engineering, Bellingham, WA

Erscheinungsjahr

1989

Einband

Soft cover

Zustand

Very Good

Buchtyp

Book

Verk�uferkataloge

Science

Anbieterinformationen

Online bookseller, previously owner of Book Bazaar, established in 1974.

Zur Homepage des Verk�ufers

Unternehmensdaten des Verk�ufers

J. Wyatt Books
ON, Canada

Gesch�ftsbedingungen und Versandinformationen

Verkaufsbedingungen

Visa, MasterCard accepted. 5% GST will be added to Canadian orders. All books guaranteed as described and may be returned within 5 days of receipt and notification. Restocking charges may apply. Shipping costs are the responsibility of the buyer. AIRmail includes insurance. Surface mail outside Canada and U.S.A. does not include insurance and will be at the buyer's risk. Online books are in a separate location from my bookstore.

Versandbedingungen

We ship within 24 hours of accepting orders.

Zahlungsarten

Zu Kaufgesuchen hinzuf�gen