528 pages in near fine condition. Volume IV, covering the year 1990. Pages are clean and unmarked with black and white illustrations throughout. Page edges are lightly smudged. Bound in yellow card covers with black titles. Lightly worn around the edges. Wrinkled and marked on the spine. Some marks and creases on the lower cover. NF Size: 8 /12 x 11.

Bestandsnummer des Verk�ufers 232178

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Bibliografische Details

Titel

INTEGRATED CIRCUIT METROLOGY, INSPECTION, AND PROCESS CONTROL IV

Verlag

SPIE - The International Society for Optical Engineering, Bellingham, WA

Erscheinungsjahr

1990

Einband

Soft cover

Zustand

Near Fine

Buchtyp

Book

Verk�uferkataloge

Science

Anbieterinformationen

Online bookseller, previously owner of Book Bazaar, established in 1974.

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Unternehmensdaten des Verk�ufers

J. Wyatt Books
ON, Canada

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