Failure-Free Integrated Circuit Packages: Systematic Elimination of Failures Through Reliability Engineering, Failure Analysis, and Material Improveme

The shrinking of integrated circuits (ICs) puts tremendous stress on overall device reliability. This unique treatment uses graphic illustration to clearly identify all major failure mode types, so engineers can spot failures before they occur.

Charles Cohn is a distinguished member of the technical staff at Agere Systems, Allentown, Pennsylvania, where he is the lead resource on PCB technology, supporting the development of advanced organic PBGA substrates for wire bonded and flip chip IC interconnections. He has authored chapters in several McGraw-Hill electronic packaging handbooks and presented numerous papers on electronic packaging. He has been awarded 11 U.S. patents on IC packaging. Mr. Cohn holds B.S., M.S., and M.E. degrees in mechanical engineering from Columbia University.

Charles A. Harper is president of Technology Seminars, Inc., Lutherville, Maryland, an organization dedicated to the presentation of educational seminars on electronic packaging and materials. He has authored over a dozen well-known books in the field and is among the founders and past presidents of the International Microelectronics Electronic and Packaging Society. He is also series editor for the McGraw-Hill Electronic Packaging and Interconnection Series. Mr. Harper is a graduate of the Johns Hopkins University School of Engineering, where he also served as adjunct professor.

Joze E. Antol - Member of Technical Staff in the Packaging and Interconnect Technology Dept. at Agere Systems, Allentown, PA. She has worked at AT&T Bell Labs / Lucent Technologies / Agere Systems for 20 years. Her current assignment focuses on the effects of probe and packaging on advanced IC technologies, such as 130nm copper / Low K. Previous assignments at AT&T / Lucent included die/wire bond process engineer in manufacturing and laboratory analyst responsible for ICP emission spectroscopy. She holds an AS degree in Chemical Engineering from Pennsylvania State University.

Frank A. Baiocchi – Distinguished Member of Technical Staff at Agere Systems, Allentown, PA. Dr. Baiocchi has been with AT&T / Lucent Technologies / Agere Systems for 21 years and is currently an analyst in the Product Analysis Laboratory involved in failure site analysis on a wide variety of analog and digital technologies. He has had responsibility for plasma etch process development in support of a CMOS manufacturing line and developed an LDMOS wafer fabrication process for an RF power transistor product. His experience includes materials characterization for silicon and III-V based semiconductor devices, plasma process engineering and silicon process technology. He has published more than 40 technical articles on analysis of thin film materials using accelerator based techniques such as Rutherford Backscattering. Dr. Baiocchi holds a BS degree in Chemistry from DePaul University and a PhD degree in Physical Chemistry from Harvard University.

Anthony J. Bucha – Senior Member of Technical Staff at Agere Systems, Allentown, PA. Mr. Bucha has been with Western Electric / AT&T Technologies / Lucent Technologies/ and Agere Systems for 24 years and is currently a Senior Analyst in the Product Analysis Lab. His responsibilities include product analysis for the reliability, qualification and yield improvement programs as well as administration of the labs safety program, and ISO 9001/2000 standards and documentation implementation. Previous work included opto-electronic device analysis, wafer yield improvement, and process characterization. He has written and co-authored several papers on product analysis and deprocessing techniques, some which were presented at various conferences including the International Symposium for Testing and Failure Analysis. Mr. Bucha was an active member of SEMATECH/International and the International Symposium for Testing and Failure Analysis Society.

James T. Cargo – Technical Manager at Agere Systems, Allentown, PA. Mr. Cargo has been with AT&T Bell Labs / Lucent Technologies / Agere Systems for 19 years. He started his career in AT&T Bell Lab’s Integrated Circuits Technology R&D Laboratory. Over the years he has worked in several capacities including: ultra trace analytical chemistry, co-founding AT&T Analytical Services, Focused Ion Beam work and Failure Analysis, as they pertain to integrated circuits, optoelectronic components and MEMS devices. He has been actively involved in the Sematech Product Analysis Forum (PAF) and Sematech Assembly Analysis Forum (AAF). In addition, he has authored or coauthored more than 30 research papers and has 3 patents. Currently, Mr. Cargo manages Agere System’s Product Analysis Lab, which is responsible for integrated circuit/package analysis associated with customer returns, engineering studies, qualification, reliability, yield improvement, design modifications, and latch-up evaluation. Mr. Cargo holds a BS degree in Chemistry from Syracuse University, a MS degree in Chemistry and a MBA from Lehigh University

John M. DeLucca – Member of Technical Staff at Agere Systems, Allentown, PA. Dr. DeLucca has been with Lucent Technologies / Agere Systems for four years and is currently a product and failure analyst in the Product Analysis Laboratory. He is the lead resource for transmission electron microscopy issues supporting customer returns, developmental work, and intellectual property-related issues. Prior to joining the product analysis group, Dr. DeLucca worked in several capacities including Supply Line Management, Reliability and Qualification, and more recently, Customer Technical Support for optoelectronic products. Dr. DeLucca graduated in 2000 with a PhD in Materials Engineering from the Pennsylvania State University from which he also holds an MS degree in Materials. He received a BSE in Materials Science and Engineering from the University of Pennsylvania in 1994. He has written and presented several papers on processing and characterization of wide band gap semiconductors and was awarded a Materials Research Society Graduate Student award in 1998.

Barry J. Dutt – Distinguished Member of Technical Staff at Agere Systems, Allentown, PA. Mr. Dutt has been with AT&T Bell Labs / Lucent Technologies / Agere Systems for 23 years. For the past 14 years he has worked in failure analysis and is currently a senior analyst in the Product Analysis Laboratory. He routinely performs product analysis on qualification, reliability, and manufacturing failures as well as customer returns and engineering evaluations related to design and process development. Previous analysis activities have also included opto-electronic and MEM’s devices. While at Bell Laboratories, he was a member of the Digital Signal Processor design team, working in the areas of circuit simulation debug and circuit design. He has co-authored several papers, and presented at the International Symposium for Testing and Failure Analysis.

Jason P. Goodelle - Distinguished Member of Technical Staff at Agere Systems, Allentown, PA in the Packaging and Interconnect Technology Dept. In his 6 years with Agere Systems, he has been responsible for developing several advanced package assembly solutions (including flip chip and multi chip modules) both internally and through cooperative development efforts at various subcontractors. Dr. Goodelle obtained a BS in physics from Allegheny College and a PhD in Materials Science and Engineering from Lehigh University, specializing in mechanical and physical properties of bulk and thin film polymers. Dr. Goodelle has authored or co-authored several papers in the area of packaging solutions and materials for IC packaging.

Kultaransingh N. Hooghan – Senior Member of Technical Staff at Agere Systems, Allentown, PA. Mr. Hooghan has been with Lucent Technologies/Agere Systems for 7 years as a Failure Analyst in the Product Analysis Dept. His primary responsibility is carrying out Physical Failure Analyses using a Focused Ion Beam (FIB) system. He has three US patents pending on processes for FIB systems. Mr. Hooghan published numerous papers and authored a chapter in a book titled “Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques, and Practice”. He also presented seminars related to FIB Systems. He holds a Masters Degree in Physics from the Bombay University, India and a Masters Degree in Engineering Technology from the University of North Texas.

John W. Osenbach - Consulting Member of Technical Staff at Agere Systems, Allentown, PA. Dr. Osenbach has been with AT&T Bell Labs/Lucent Technologies/Agere Systems for 22 years. The first half was spent in the development and reliability of silicon technology processes and materials, primarily dielectrics and metals for application on high voltage, high speed, CMOS devices. The next 10 years were devoted to metals, dielectrics, and package development for single mode laser based products. He helped develop a device and package technology that provided for the first time a reliable non-hermetic single mode laser and photodiode package technology. Currently, Dr. Osenbach is focused on package technology development for silicon integrated circuits. He has authored and co-authored more than 70 papers and was awarded 33 US patents. He organized and chaired a number of conferences on silicon technology and optoelectronic packaging, and taught conference courses on reliability of optoelectronic devices. He is a past associate editor of the Journal of Electrochemical Society. In 1999 he was made a Bell Laboratories Fellow for his work on the development of materials and processes needed for the manufacture of reliable non-hermetic opto-electronic and SIC packages. He holds a BS, MS and PhD in Ceramic Science and Engineering from Pennsylvania State University.

Albert C. Seier - Member of Technical Staff at Agere Systems, Allentown, PA. Mr. Seier has been with Lucent/Agere for six years and is currently a product analyst focusing on Agere worldwide electrical failure analysis needs with emphasis on electrical hardware. In addition, he interfaces with quality managers and lab analysts to ensure timely closure on customer returns. Managing laboratory case data entry is also among his responsibilities. Prior to joining Agere, Mr. Seier worked in research and development of electrical connectors for Thomas and Betts Corp. where he sat on the ANSI C119.4 standards committee. He co-authored a paper for IPFA2003 entitled “Overview of Cu/low K Technology Failure Analysis and Reliability Issues”. Mr. Seier holds a BSEE from Lafayette College.

Brian A. Sensenig – Senior Manager, Agere Systems Singapore Pte, Ltd, Singapore. Mr. Sensenig has been with Lucent Technologies / Agere Systems for 5 years and is currently a Senior Manager in the Global Procurement Organization headquartered in Singapore. He is responsible for the External Contract Manufacturing Assembly and Test services for Agere. Prior relocating to Singapore in September 2003, Mr. Sensenig worked in Agere’s headquarters in Allentown, PA as the lead procurement resource providing purchasing counsel and support to Agere’s Packaging & Interconnect Team for new package technologies. He maintains close relationships with a broad spectrum of organic and SATS suppliers world wide to continually assess their latest technologies and manufacturing capabilities. Mr. Sensenig holds a MBA from DeSales University and is an Approved Purchasing Practitioner (A.P.P.) and Certified Purchasing Manager (C.P.M.) from the Institute for Supply Management (ISM).

Joseph W. Serpiello - Distinguished Member of Technical Staff at Agere Systems, Allentown, PA. Mr. Serpiello has been affiliated with Bell Labs, AT&T Microelectronics, Lucent Technologies, and Agere Systems over the past 33 years, including 3 years with Solid State Scientific as a Senior Design Engineer in the Memory Products Group involved in high performance CMOS SRAM design. For the past 18 years he has worked in failure analysis and is currently a Senior Analyst in the Product Analysis Laboratory at Agere. He routinely performs failure analysis on qualification, reliability, and manufacturing failures as well as customer returns and engineering evaluations related to design and process development. While at Bell Labs, he was a member of the Logic and Memory Devices Group, involved in the areas of automated testing, parameter extraction, device modeling, alpha-radiation measurements of materials, circuit simulation and SRAM design. He was a former member of the SEMATECH Product Analysis Forum (PAF) and has co-authored several papers that were presented at the International Symposium for Testing and Failure Analysis (ISTFA) and the International Reliability Physics Symposium (IRPS). Mr. Serpiello holds degrees in electrical engineering from Temple University and Lafayette College (BSEE).

Melissa E. Grupen-Shemansky – Director of Packaging and Interconnection Technology Dept. at Agere Systems, Allentown, PA. Dr. Grupen-Shemansky has been with Agere Systems for 5 years managing high volume process technology development teams at the Agere factories in Thailand and Singapore, design teams in five locations worldwide, and a core packaging and interconnect technology team in the United States. Prior to joining Agere she had been with Motorola for 10 years in the Semiconductor Products Sector R&D labs and Manufacturing. Dr. Grupen-Shemansky’s research responsibilities involved the development of selective polycrystalline silicon CVD techniques, GaAs RIE, wafer thinning, and wafer bonding. In 1992, she became a fab section manager within the Compound Semiconductor-1 GaAs device manufacturing line. Subsequently, her technical interests shifted to the development of IC and MEMS packaging, which called for collaborations with Motorola-Europe and Asia. Dr. Grupen-Shemansky received combined BS and MS degrees in Chemical Engineering from the Pennsylvania State University and her PhD from Arizona State University. Her academic research activities were interdisciplinary combining biomedical, electrical, and chemical engineering skills. She received various technical awards throughout her career, has been issued seven US patents, and has over 30 publications in several technical fields.

Richard L. Shook - Consulting Member of Technical Staff at Agere Systems, Allentown, PA, in the Packaging and Interconnect Technology Dept. Dr. Shook has been with AT&T Bell Labs / Lucent Technologies / Agere Systems for 20 years where his responsibilities include IC package development and reliability assessment, as well as moisture/reflow sensitivity issues. Recent research activities involved Pb-free assembly effects associated with package body warpage and Sn-whisker growth. He has contributed to the US industry standardization of moisture/reflow testing, through active participation on JEDEC and IPC committees. Some of Dr. Shook’s technical contributions have been the development of the accelerated 60°C/60%RH test criteria incorporated in the joint IPC/JEDEC moisture sensitivity specification J-STD-020, and the development of moisture derating and baking procedures adopted in the joint handling specification J-STD-033. He has published extensively on the topic of moisture/reflow sensitivity and has received an outstanding paper award at the 1999 ECTC conference. He also received JEDEC and IPC technical recognition awards for his work on this topic. Dr. Shook has a PhD in Metallurgical Engineering from the Ohio State University.

Ronald J. Weachock - Senior Member of Technical Staff in the Product Realization Department at Agere Systems, Allentown, Pa. Mr. Weachock has been with Western Electric / AT&T Bell Labs / Lucent Technologies / Agere Systems for 20 years. He has worked extensively as a Failure Analysis Engineer for Qualification and Reliability of application specific integrated circuits (ASICs). He is currently involved in semiconductor root cause failure analysis in the field of advanced packaging and interconnect technologies, including standard packages, ball grid arrays (BGAs), advanced single-chip thermally enhanced packaging, and multi-chip modules (MCM). He specializes in defect analysis of high pin count flip chip package/interconnects and defect analysis for reliability assessment of advanced electronic package interconnects systems for new product. He has co-authored “Assessment of Flip Chip Interconnect Integrity using Scanning Acoustic Microscopy” and contributed to several technical papers in the area of electronic-packaging-stress-related-issues. He received his BSEET from Pennsylvania State University.

Huixian Wu – Member of Technical Staff at Agere Systems, Allentown, PA. Ms. Wu has been with Agere Systems for four years, working on advanced FA development and integrated circuit/package product analysis associated with technology development, customer returns, qualification, reliability, yield improvement, and design modifications. Ms. Wu received her BS degree both in Material Science & Engineering, and Computer Science & Engineering with highest honor in 1996, and M.S. degree in Semiconductor Materials in 1998 from the Zhejiang University in China and another MS degree in Reliability Engineering from the University of Maryland in 2000. She is a now PhD candidate in the Dept. of Electrical and Computer Engineering at Lehigh University. Ms. Wu has authored or coauthored 18 research papers.

Weidong Xie – Senior Member of Technical Staff at Agere Systems, Allentown, PA. in the Packaging and Interconnection Technology Dept. Dr Xie joined Agere in 2001 and has been involved in new packaging technology developments with emphasis in finite element analysis, thermo-mechanical modeling, interfacial delamination, solder joint fatigue, and packaging reliability qualification. He has over nine years experience in structural durability and damage tolerance evaluation and experiment. Dr. Xie holds a Bachelor’s Degree in engineering from the Harbin Shipbuilding Engineering Institute, Harbin, China and a Master’s Degree in Solids Mechanics from the Northwestern Polytechnic University, Xian, China. He also holds a MS in Aerospace Engineering and a PhD in Mechanical Engineering from Georgia Institute of Technology.