This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

�ber die Autorin bzw. den Autor:

Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.

Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.

Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.

��ber diesen Titel� kann sich auf eine andere Ausgabe dieses Titels beziehen.

Anbieterinformationen

BooksRun helps to save money on textbooks. We are committed to providing each customer with the highest standard of customer service. Please pay close attention to the description of the book and its condition you are ordering. If you have any questions or issues, please make sure to contact us first so we could resolve them. All orders are shipped on the same or the next business day. It usually takes 1 to 5 business days to receive your item if you choose expedited shipping. All orders submitted are eligible for a return within 30 days after the delivery. Thanks for shopping with us!

Zur Homepage des Verk�ufers