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Titel: Design and Test Techniques for Very Large Scale Integration and Wafer Scale Integration (IEE computing series)
Verlag: Institution of Engineering and Technology
Erscheinungsjahr: 1989
Sprache: Englisch
ISBN-10: 0863411657
ISBN-13: 9780863411656
Einband: Hardcover
Zustand: Good
Gewicht: 567 Gramm

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This book provides an up-to-date view of VLSI and WSI design and test methodologies, combining an introduction to the topics covered with an indication of current research directions and results. The coverage is thus suitable for undergraduates studying microelectronic systems design, for postgraduate researchers and for graduate engineers and managers seeking an overview or introduction to semi- and full-custom large-scale chip design. The contributions have been carefully chosen to take the reader from an introductory treatment of the gate array design route, very typically favoured by new entrants into the business of custom chip design, through a study of more ambitious design tools that allow the user to progress naturally to full-custom design. Having establihsed the style of design tools that are either in current use, or which are likely to set the future style of chip design packages, the book moves on to review the related fields of design-for-testability and fault tolerant VLSI design. The final section of the book deals with the concept of Wafer Scale Integration - WSI - which offers very exciting opportunities for devices of large system-scale complexities.

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