248 pp., Hardcover, minor internal library markings else text clean & binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.

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Bibliografische Details

Titel: Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (Volume 163) (Advances in Imaging and Electron Physics, Volume 163)
Verlag: Academic Press
Erscheinungsjahr: 2010
Sprache: Englisch
ISBN-10: 012381314X
ISBN-13: 9780123813145
Einband: Hardcover
Zustand: Very Good

�ber diesen Titel

Inhaltsangabe

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

�ber die Autorin bzw. den Autor

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

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