Investigations on rf breakdown phenomenon in high gradient accelerating structures (Springer Theses) - Hardcover

Buch 402 von 797: Springer Theses

Shao, Jiahang

 
9789811079252: Investigations on rf breakdown phenomenon in high gradient accelerating structures (Springer Theses)
Hardcover
ISBN 10: 9811079250 ISBN 13: 9789811079252
Verlag: Springer, 2018

Inhaltsangabe

This book mainly focuses on the experimental research of rf breakdown and field emission with novel methods, including triggering rf breakdown with high intensity laser and pin-shaped cathodes as well as locating field emitters with a high resolution in-situ imaging system. With these methods, this book has analyzed the power flow between cells during rf breakdown, observed the evolution of field emission during rf conditioning and the dependence of field emission on stored energy, and studied the field emitter distribution and origination. The research findings greatly expand the understanding of rf breakdown and field emission, which will in turn benefit future study into electron sources, particle accelerators, and high gradient rf devices in general. 

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Über die Autorin bzw. den Autor

Jiahang Shao received his Bachelor’s degree in Engineering from the Department of Electronic Engineering at Tsinghua University, China in 2011. He obtained his Ph.D. in Engineering from the Department of Engineering Physics at the same university in July 2016, where his major research project in Prof. Huaibi Chen’s group was the experimental study of rf breakdown and field emission in high gradient accelerating structures. Currently, he is a postdoctoral appointee working with Prof. Wei Gai at Argonne National Laboratory, USA, continuing his study on field emission and conducting research on wakefield generation by intense electron beam.

Von der hinteren Coverseite

This book mainly focuses on the experimental research of rf breakdown and field emission with novel methods, including triggering rf breakdown with high intensity laser and pin-shaped cathodes as well as locating field emitters with a high resolution in-situ imaging system. With these methods, this book has analyzed the power flow between cells during rf breakdown, observed the evolution of field emission during rf conditioning and the dependence of field emission on stored energy, and studied the field emitter distribution and origination. The research findings greatly expand the understanding of rf breakdown and field emission, which will in turn benefit future study into electron sources, particle accelerators, and high gradient rf devices in general.

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Verlag
Springer
Erscheinungsdatum
2018
Sprache
Englisch
ISBN 10 
9811079250
ISBN 13 
9789811079252
Einband
Gebundene Ausgabe
Auflage
1
Anzahl der Seiten
145
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Softcover