VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science, 711, Band 711) - Softcover
Buch 183 von 437: Communications in Computer and Information Science
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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 â" July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711)
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paperback. Zustand: Very Good. VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 â" July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. . Artikel-Nr. 7719-9789811074691
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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 ? July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711)
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VLSI Design and Test
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ISBN 13: 9789811074691
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Taschenbuch. Zustand: Neu. Neuware -This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 840 pp. Englisch. Artikel-Nr. 9789811074691
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Vlsi Design and Test: 21st International Symposium, Vdat 2017, Roorkee, India, June 29-july 2, 2017, Revised Selected Papers
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Paperback. Zustand: Brand New. revised edition. 840 pages. 9.25x6.10x1.73 inches. In Stock. Artikel-Nr. x-9811074690
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VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
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Springer Nature Singapore, Springer Nature Singapore, 2017
ISBN 10: 9811074690
ISBN 13: 9789811074691
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Taschenbuch. Zustand: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. Artikel-Nr. 9789811074691
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