This Solution Manual, a companion volume of the book, Fundamentals of Solid-State Electronics, provides the solutions to selected problems listed in the book. Most of the solutions are for the selected problems that had been assigned to the engineering undergraduate students who were taking an introductory device core course using this book.This Solution Manual also contains an extensive appendix which illustrates the application of the fundamentals to solutions of state-of-the-art transistor reliability problems which have been taught to advanced undergraduate and graduate students.
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Anbieter: Revaluation Books, Exeter, Vereinigtes Königreich
Paperback. Zustand: Brand New. 200 pages. 9.00x6.25x0.75 inches. In Stock. Artikel-Nr. x-9810228813
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Anbieter: Kennys Bookstore, Olney, MD, USA
Zustand: New. Accompanying the "Study Guide", this manual provides solutions for selected problems from both an introductory device core course for undergraduates, and a transistor reliability physics course and engineering discussions for advanced undergraduate/graduate students, taught at Florida University. Editor(s): Caelli, Terry Michael. Num Pages: 212 pages, diagrams, figures. BIC Classification: PHFC; TJFC; TJFD5. Category: (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate; (XX) Exams / tests / exercises. Dimension: 250 x 150 x 10. Weight in Grams: 295. . 1996. Illustrated. paperback. . . . . Books ship from the US and Ireland. Artikel-Nr. V9789810228811
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Anbieter: moluna, Greven, Deutschland
Zustand: New. KlappentextrnrnAccompanying the Study Guide , this manual provides solutions for selected problems from both an introductory device core course for undergraduates, and a transistor reliability physics course and engineering discussions for adva. Artikel-Nr. 909655571
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Anbieter: Buchpark, Trebbin, Deutschland
Zustand: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | This Solution Manual, a companion volume of the book, Fundamentals of Solid-State Electronics, provides the solutions to selected problems listed in the book. Most of the solutions are for the selected problems that had been assigned to the engineering undergraduate students who were taking an introductory device core course using this book.This Solution Manual also contains an extensive appendix which illustrates the application of the fundamentals to solutions of state-of-the-art transistor reliability problems which have been taught to advanced undergraduate and graduate students. Artikel-Nr. 1246853/203
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