Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault - Softcover

Inhaltsangabe

Contributing Authors. Preface. To Christian: a Real Test & Taste Expert. From LAAS to LIRMM and Beyond.

1. Open Defects in Nanometer Technologies; J. Figueras, R. Rodríguez-Montañés, D. Arumí

2. Models for Bridging Defects; M. Renovell, F. Azais, J. Figueras, R. Rodriguez-Montanes, D. Arumi

3. Models for Delay Faults; S.M. Reddy

4. Fault Modeling for Simulation and ATPG; B.Becker, I.Polian

5. Generalized Fault Modeling for Logic Diagnosis; H.-J. Wunderlich, S. Holst

6. Models in Memory Testing; S.Di Carlo, P.Prinetto

7. Models for Power-Aware Testing; P.Girard, H.-J.Wunderlich

8. Physical Fault Models and Fault Tolerance; J.Arlat, Y.Crouzet

Index.

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